IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2006-04-14 11:15
DRAM技術を用いた16M SRAM
Yuji Kihara, Yasushi Nakashima, Takashi Izutsu, Masayuki Nakamoto (Renesas), Tsutomu Yoshihara (Waseda Univ.) Link to ES Tech. Rep. Archives: ICD2006-15
Abstract (in Japanese) (See Japanese page) 
(in English) A 16Mbit Low Power SRAM with 0.98um2 cells using 0.15um DRAM and TFT technology has been developed. A new type memory cell technology achieves enough low power, low cost and high soft error immunity without large investment. By these improved characteristics some customers at industrial machines and handy devices decided to use this new type of SRAM by compatibility with SRAM.
Keyword (in Japanese) (See Japanese page) 
(in English) SRAM / SuperSRAM / Soft error free / Low voltage operation / Small size SRAM memory cell / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 2, ICD2006-15, pp. 81-84, April 2006.
Paper # ICD2006-15 
Date of Issue 2006-04-06 (ICD) 
ISSN Print edition: ISSN 0913-5685
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: ICD2006-15

Conference Information
Committee ICD  
Conference Date 2006-04-13 - 2006-04-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Oita University 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2006-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) DRAM技術を用いた16M SRAM 
Sub Title (in English)  
Keyword(1) SRAM  
Keyword(2) SuperSRAM  
Keyword(3) Soft error free  
Keyword(4) Low voltage operation  
Keyword(5) Small size SRAM memory cell  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yuji Kihara  
1st Author's Affiliation Renesas Technology (Renesas)
2nd Author's Name Yasushi Nakashima  
2nd Author's Affiliation Renesas Technology (Renesas)
3rd Author's Name Takashi Izutsu  
3rd Author's Affiliation Renesas Technology (Renesas)
4th Author's Name Masayuki Nakamoto  
4th Author's Affiliation Renesas Technology (Renesas)
5th Author's Name Tsutomu Yoshihara  
5th Author's Affiliation Waseda University Graduated School (Waseda Univ.)
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2006-04-14 11:15:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2006-15 
Volume (vol) vol.106 
Number (no) no.2 
Page pp.81-84 
#Pages
Date of Issue 2006-04-06 (ICD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan