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| Presentation | 2006-04-14 13:50 Worst-Case Ananlysis to Obtain Stable Read/Write DC Margin of High Density 6T-SRAM-Array with Local Vth Variability Yasumasa Tsukamoto, Koji Nii (Renesas Technology), Susumu Imaoka (Renesas Design), Yuji Oda (Shikino High-Tech.), Shigeki Ohbayashi, Makoto Yabuuchi, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara (Renesas Technology) Link to ES Tech. Rep. Archives:  ICD2006-18 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | (Not available yet) | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | / / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 106, no. 2, ICD2006-18, pp. 97-102, April 2006. | |
| Paper # | ICD2006-18 | |
| Date of Issue | 2006-04-06 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | Link to ES Tech. Rep. Archives: ICD2006-18 |
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| Conference Information | |
| Committee | ICD |
| Conference Date | 2006-04-13 - 2006-04-14 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Oita University |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2006-04-ICD |
| Language | English (Japanese title is available) |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Worst-Case Ananlysis to Obtain Stable Read/Write DC Margin of High Density 6T-SRAM-Array with Local Vth Variability |
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| 1st Author's Name | Yasumasa Tsukamoto |
| 1st Author's Affiliation | Renesas Technology (Renesas Technology) |
| 2nd Author's Name | Koji Nii |
| 2nd Author's Affiliation | Renesas Technology (Renesas Technology) |
| 3rd Author's Name | Susumu Imaoka |
| 3rd Author's Affiliation | Renesas Design Corporation (Renesas Design) |
| 4th Author's Name | Yuji Oda |
| 4th Author's Affiliation | Shikino High-Tech (Shikino High-Tech.) |
| 5th Author's Name | Shigeki Ohbayashi |
| 5th Author's Affiliation | Renesas Technology (Renesas Technology) |
| 6th Author's Name | Makoto Yabuuchi |
| 6th Author's Affiliation | Renesas Technology (Renesas Technology) |
| 7th Author's Name | Hiroshi Makino |
| 7th Author's Affiliation | Renesas Technology (Renesas Technology) |
| 8th Author's Name | Koichiro Ishibashi |
| 8th Author's Affiliation | Renesas Technology (Renesas Technology) |
| 9th Author's Name | Hirofumi Shinohara |
| 9th Author's Affiliation | Renesas Technology (Renesas Technology) |
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| Speaker | Author-1 |
| Date Time | 2006-04-14 13:50:00 |
| Presentation Time | 25 minutes |
| Registration for | ICD |
| Paper # | ICD2006-18 |
| Volume (vol) | vol.106 |
| Number (no) | no.2 |
| Page | pp.97-102 |
| #Pages | 6 |
| Date of Issue | 2006-04-06 (ICD) |
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