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Paper Abstract and Keywords
Presentation 2005-12-09 16:35
Evaluation of occlusion-tolerant face authentication using auto-associative memory
Hiroshi Kage, Shitaro Watanabe, Ken-ichi Tanaka, Kazuo Kyuma (Mitsbubishi Electric Corporation)
Abstract (in Japanese) (See Japanese page) 
(in English) Even the latest face authentication systems still have problems caused by illumination condition, face pose, facial expression, or partial occlusion. In terms of video surveillance, it will be important to cope with partial occlusion cases brought about by masks or sunglasses. We propose the possibility of an occlusion-tolerant face authentication system based on auto-associative memory. To construct the auto-associative memory, we used Widrow-Hoff learning rule. To evaluate the performance of our method, we applied it to several cases including facial occlusion and expression, and clarified its effectiveness to enhance the performance of our current face authentication system.
Keyword (in Japanese) (See Japanese page) 
(in English) Associative Memory / Face Recognition / Occlusion-tolerant / Video Surveillance / / / /  
Reference Info. IEICE Tech. Rep., vol. 105, no. 457, NC2005-89, pp. 49-54, Dec. 2005.
Paper # NC2005-89 
Date of Issue 2005-12-02 (NC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Conference Information
Committee MBE NC  
Conference Date 2005-12-09 - 2005-12-09 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) General 
Paper Information
Registration To NC 
Conference Code 2005-12-MBE-NC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of occlusion-tolerant face authentication using auto-associative memory 
Sub Title (in English)  
Keyword(1) Associative Memory  
Keyword(2) Face Recognition  
Keyword(3) Occlusion-tolerant  
Keyword(4) Video Surveillance  
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1st Author's Name Hiroshi Kage  
1st Author's Affiliation Advanced Technology R&D center, Mitsbubishi Electric Corporation (Mitsbubishi Electric Corporation)
2nd Author's Name Shitaro Watanabe  
2nd Author's Affiliation Advanced Technology R&D center, Mitsbubishi Electric Corporation (Mitsbubishi Electric Corporation)
3rd Author's Name Ken-ichi Tanaka  
3rd Author's Affiliation Advanced Technology R&D center, Mitsbubishi Electric Corporation (Mitsbubishi Electric Corporation)
4th Author's Name Kazuo Kyuma  
4th Author's Affiliation Advanced Technology R&D center, Mitsbubishi Electric Corporation (Mitsbubishi Electric Corporation)
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Speaker
Date Time 2005-12-09 16:35:00 
Presentation Time 25 
Registration for NC 
Paper # IEICE-NC2005-89 
Volume (vol) IEICE-105 
Number (no) no.457 
Page pp.49-54 
#Pages IEICE-6 
Date of Issue IEICE-NC-2005-12-02 


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