IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2005-11-07 09:00
Statistical Analysis of Artifacts on CT Images Using Statistics of Extremes -- A New Method for Evaluation Artifacts with Gumbel Analysis :”Gumbel Evaluation Method” --
Kuniharu Imai, Mitsuru Ikeda (Nagoya Univ.), Yukihiro Enchi (Osaka Univ. Hosp.), Takanaga Niimi (Nagoya Univ.), Shinichi Wada (Niigata Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 105, no. 386, MI2005-50, pp. 1-6, Nov. 2005.
Paper # MI2005-50 
Date of Issue 2005-10-31 (MI) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Download PDF

Conference Information
Committee MI  
Conference Date 2005-11-07 - 2005-11-07 
Place (in Japanese) (See Japanese page) 
Place (in English) NIRS 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To MI 
Conference Code 2005-11-MI 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Statistical Analysis of Artifacts on CT Images Using Statistics of Extremes 
Sub Title (in English) A New Method for Evaluation Artifacts with Gumbel Analysis :”Gumbel Evaluation Method” 
1st Author's Name Kuniharu Imai  
1st Author's Affiliation Nagoya University (Nagoya Univ.)
2nd Author's Name Mitsuru Ikeda  
2nd Author's Affiliation Nagoya University (Nagoya Univ.)
3rd Author's Name Yukihiro Enchi  
3rd Author's Affiliation Osaka University Hospital (Osaka Univ. Hosp.)
4th Author's Name Takanaga Niimi  
4th Author's Affiliation Nagoya University (Nagoya Univ.)
5th Author's Name Shinichi Wada  
5th Author's Affiliation Niigata University (Niigata Univ.)
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2005-11-07 09:00:00 
Presentation Time 25 
Registration for MI 
Paper # IEICE-MI2005-50 
Volume (vol) IEICE-105 
Number (no) no.386 
Page pp.1-6 
#Pages IEICE-6 
Date of Issue IEICE-MI-2005-10-31 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan