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| Presentation | 2005-10-27 13:55 Condition for the Non-Invasiveness of Coaxial Type Electric Field Probe (The Second) Takashi Kasuga, Hiroshi Inoue (Akita Univ.) Link to ES Tech. Rep. Archives:  MW2005-93 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | It is desired to develop the non-invasive electric field probe that can measure the near electric field on the PCB. Conditions for the non-invasiveness of a coaxial type electric field probe are discussed about the length and the termination. The electric field distributions on the PCB are analyzed by FDTD method and compared with theoretical electric field distribution. When the length of the outer conductor of cable and terminal impedance are changed, the conditions for the invasiveness are also discussed. The electric field distribution detected by the electric field probe that the length of outer conductor is 10~mm and terminal resistance is larger than $1~\mathrm{k}\Omega$ is coincided with theoretical one. It is demonstrated that the non-invasiveness condition can be applied under the different frequency and position. As the electric field distribution is changed by the length of the electric probe, the cable outer conductor influences the electric field distribution. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Near electric field / Electric field probe / PCB / Non-invasiveness / FDTD method / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 105, no. 366, EMCJ2005-87, pp. 41-46, Oct. 2005. | |
| Paper # | EMCJ2005-87 | |
| Date of Issue | 2005-10-20 (EMCJ, MW) | |
| ISSN | Print edition: ISSN 0913-5685 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | Link to ES Tech. Rep. Archives: MW2005-93 |
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| Conference Information | |
| Committee | EMCJ MW |
| Conference Date | 2005-10-27 - 2005-10-28 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Akita University |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EMCJ |
| Conference Code | 2005-10-EMCJ-MW |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Condition for the Non-Invasiveness of Coaxial Type Electric Field Probe (The Second) |
| Sub Title (in English) | |
| Keyword(1) | Near electric field |
| Keyword(2) | Electric field probe |
| Keyword(3) | PCB |
| Keyword(4) | Non-invasiveness |
| Keyword(5) | FDTD method |
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| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Takashi Kasuga |
| 1st Author's Affiliation | Akita University (Akita Univ.) |
| 2nd Author's Name | Hiroshi Inoue |
| 2nd Author's Affiliation | Akita University (Akita Univ.) |
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| Speaker | Author-1 |
| Date Time | 2005-10-27 13:55:00 |
| Presentation Time | 25 minutes |
| Registration for | EMCJ |
| Paper # | EMCJ2005-87, MW2005-93 |
| Volume (vol) | vol.105 |
| Number (no) | no.366(EMCJ), no.368(MW) |
| Page | pp.41-46 |
| #Pages | 6 |
| Date of Issue | 2005-10-20 (EMCJ, MW) |
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