Paper Abstract and Keywords |
Presentation |
2005-10-20 16:30
A Capacitorless Twin-Transistor Random Access Memory (TTRAM) on SOI Takayuki Gyohten, Fukashi Morishita, Hideyuki Noda (Renesas Technology Corp.), Mako Okamoto (Daioh Electric Corp.), Takashi Ipposhi, Shigeto Maegawa, Katsumi Dosaka, Kazutami Arimoto (Renesas Technology Corp.) Link to ES Tech. Rep. Archives: ICD2005-132 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We propose a novel capacitorless twin-transistor random access memory (TTRAM). The 2Mb test device has been fabricated on 130nm SOI-CMOS process. We demonstrate the TTRAM cell has two data-storage states and confirm the data retention time of 100ms at 80°C. TTRAM process is compatible with the conventional SOI-CMOS and never requires any additional processes. A 6.1ns row-access time is achieved and 250MHz operation can be realized by using 2bank 8b-burst mode. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
SOI-CMOS / Twin transistor / embedded memory / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 105, no. 351, ICD2005-132, pp. 107-112, Oct. 2005. |
Paper # |
ICD2005-132 |
Date of Issue |
2005-10-13 (SIP, ICD, IE) |
ISSN |
Print edition: ISSN 0913-5685 |
Copyright and reproduction |
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Link to ES Tech. Rep. Archives: ICD2005-132 |
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