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| Presentation | 2005-10-13 16:20 Gate Leakage Current in AlGaN/GaN High Electron Mobility Transistors Tomoyuki Yamada, Tadayoshi Tsuchiya, Junjiroh Kikawa, Masayuki Iwami (R&D Association for Future Electron Devices), Tsutomu Araki, Akira Suzuki, Yasushi Nanishi (Ritsumeikan Univ.) Link to ES Tech. Rep. Archives:  ED2005-134 CPM2005-121 LQE2005-61 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | (Not available yet) | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | / / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 105, no. 325, ED2005-134, pp. 75-78, Oct. 2005. | |
| Paper # | ED2005-134 | |
| Date of Issue | 2005-10-06 (ED, CPM, LQE) | |
| ISSN | Print edition: ISSN 0913-5685 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | Link to ES Tech. Rep. Archives: ED2005-134 CPM2005-121 LQE2005-61 |
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| Conference Information | |
| Committee | LQE ED CPM |
| Conference Date | 2005-10-13 - 2005-10-15 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Ritsumeikan Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Nitride Based Optical and Electronic Devices, Materials and Related Technologies |
| Paper Information | |
| Registration To | ED |
| Conference Code | 2005-10-LQE-ED-CPM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Gate Leakage Current in AlGaN/GaN High Electron Mobility Transistors |
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| 1st Author's Name | Tomoyuki Yamada |
| 1st Author's Affiliation | R&D Association for Future Electron Devices (R&D Association for Future Electron Devices) |
| 2nd Author's Name | Tadayoshi Tsuchiya |
| 2nd Author's Affiliation | R&D Association for Future Electron Devices (R&D Association for Future Electron Devices) |
| 3rd Author's Name | Junjiroh Kikawa |
| 3rd Author's Affiliation | R&D Association for Future Electron Devices (R&D Association for Future Electron Devices) |
| 4th Author's Name | Masayuki Iwami |
| 4th Author's Affiliation | R&D Association for Future Electron Devices (R&D Association for Future Electron Devices) |
| 5th Author's Name | Tsutomu Araki |
| 5th Author's Affiliation | Ritsumeikan University (Ritsumeikan Univ.) |
| 6th Author's Name | Akira Suzuki |
| 6th Author's Affiliation | Ritsumeikan University (Ritsumeikan Univ.) |
| 7th Author's Name | Yasushi Nanishi |
| 7th Author's Affiliation | Ritsumeikan University (Ritsumeikan Univ.) |
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| Speaker | Author-1 |
| Date Time | 2005-10-13 16:20:00 |
| Presentation Time | 20 minutes |
| Registration for | ED |
| Paper # | ED2005-134, CPM2005-121, LQE2005-61 |
| Volume (vol) | vol.105 |
| Number (no) | no.325(ED), no.327(CPM), no.329(LQE) |
| Page | pp.75-78 |
| #Pages | 4 |
| Date of Issue | 2005-10-06 (ED, CPM, LQE) |
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