| Paper Abstract and Keywords |
| Presentation |
2005-09-22 09:00
Evaluation of Moire Artifacts with Stationary Anti-scatter Grids in amorphous selenium-based Flat Panel X-ray System
Koji Oda (Anjo Kosei Hosp.), Masatoshi Tsuzaka (Nagoya Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
In radiography, the adverse effect of scattered radiation is reduced by using anti-scatter grids which improve contrast but cause increased absorbed dose in the patient. In digital imaging systems, using anti-scatter grids may lead to arise moire artifacts. Recently, amorphous selenium-based flat panel X-ray systems were developed. An important advantage of a-Se is its high spatial resolution. However, the high resolution of a-Se potentially introduces more moire artifacts. The aim of this study is to present the relation between moire artifacts and combinations of the sampling conditions and the strip density of anti-scatter grids, and to choice optimal anti-scatter grids in amorphous selenium-based flat panel X-ray system. It is not practicable to carry out such a comprehensive study by direct measurement, and a simulation computer program was developed for this purpose. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Flat Panel Detector / Moire / Anti-scatter Grid / Aliasing / Sampling / / / |
| Reference Info. |
IEICE Tech. Rep., vol. 105, no. 303, MI2005-34, pp. 19-24, Sept. 2005. |
| Paper # |
MI2005-34 |
| Date of Issue |
2005-09-14 (MI) |
| ISSN |
Print edition: ISSN 0913-5685 |
| Download PDF |
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| Conference Information |
| Committee |
MI |
| Conference Date |
2005-09-21 - 2005-09-23 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Korea Univ. Kuro Hospital |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
MI |
| Conference Code |
2005-09-MI |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Evaluation of Moire Artifacts with Stationary Anti-scatter Grids in amorphous selenium-based Flat Panel X-ray System |
| Sub Title (in English) |
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| Keyword(1) |
Flat Panel Detector |
| Keyword(2) |
Moire |
| Keyword(3) |
Anti-scatter Grid |
| Keyword(4) |
Aliasing |
| Keyword(5) |
Sampling |
| Keyword(6) |
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| Keyword(7) |
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| Keyword(8) |
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| 1st Author's Name |
Koji Oda |
| 1st Author's Affiliation |
Anjo Kosei Hospital (Anjo Kosei Hosp.) |
| 2nd Author's Name |
Masatoshi Tsuzaka |
| 2nd Author's Affiliation |
Nagoya University (Nagoya Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2005-09-22 09:00:00 |
| Presentation Time |
15 minutes |
| Registration for |
MI |
| Paper # |
MI2005-34 |
| Volume (vol) |
vol.105 |
| Number (no) |
no.303 |
| Page |
pp.19-24 |
| #Pages |
6 |
| Date of Issue |
2005-09-14 (MI) |