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Paper Abstract and Keywords
Presentation 2005-09-09 14:30
[Invited Talk] On chip transmission line interconnect
Kazuya Masu, Kenichi Okada, Hiroyuki Ito (Tokyo Institute of Technology) Link to ES Tech. Rep. Archives: CPM2005-104 ICD2005-114
Abstract (in Japanese) (See Japanese page) 
(in English) Recent Si CMOS performance becomes to be limited by the long global interconnect characteristics. In this paper, we discuss the performance of transmission line interconnect on Si CMOS chip. Interconnect line structure, design and evaluation of signal transmission of Tx/TR-Line/Rx circuit, and estimation and prediction of signal delay and power consumption of global interconnect in 180nm, 90nm and 45nm technology node are presented. In sub 100nm node, signal delay and power consumption of transmission line interconnect are both superior to those using the conventional RC global interconnect with repeaters.
Keyword (in Japanese) (See Japanese page) 
(in English) Si CMOS / Transmission Line Interconnect / Interconnect Length Distribution / / / / /  
Reference Info. IEICE Tech. Rep., vol. 105, no. 266, CPM2005-104, pp. 47-52, Sept. 2005.
Paper # CPM2005-104 
Date of Issue 2005-09-02 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685
Copyright
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reproduction
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Download PDF Link to ES Tech. Rep. Archives: CPM2005-104 ICD2005-114

Conference Information
Committee ICD CPM  
Conference Date 2005-09-08 - 2005-09-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To CPM 
Conference Code 2005-09-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) On chip transmission line interconnect 
Sub Title (in English)  
Keyword(1) Si CMOS  
Keyword(2) Transmission Line Interconnect  
Keyword(3) Interconnect Length Distribution  
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1st Author's Name Kazuya Masu  
1st Author's Affiliation Tokyo Institute of Technology (Tokyo Institute of Technology)
2nd Author's Name Kenichi Okada  
2nd Author's Affiliation Tokyo Institute of Technology (Tokyo Institute of Technology)
3rd Author's Name Hiroyuki Ito  
3rd Author's Affiliation Tokyo Institute of Technology (Tokyo Institute of Technology)
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Speaker Author-1 
Date Time 2005-09-09 14:30:00 
Presentation Time 50 minutes 
Registration for CPM 
Paper # CPM2005-104, ICD2005-114 
Volume (vol) vol.105 
Number (no) no.266(CPM), no.268(ICD) 
Page pp.47-52 
#Pages
Date of Issue 2005-09-02 (CPM, ICD) 


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