Paper Abstract and Keywords |
Presentation |
2005-07-15 13:50
* Toshinori Otaka, Yan Lee, Timothy Bales, Paul Smith, Jonathan MacDowell, Scott Smith, Isao Takayanagi (Micron Japan) Link to ES Tech. Rep. Archives: ICD2005-61 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Ramp analog-to-digital converters (ADC) have been widely used for column-parallel ADCs in imagers for several reasons: simple implementation, low power consumption, and guarantee of high linearity and monotonicity. One drawback to using a ramp ADC is its slow operation speed when bit resolution is increased. In this paper we propose an accelerated ramp scheme based on photon shot noise limited characteristics of an image signal. Influence of the accelerated ramp-to-image quality was investigated by simulation, which confirmed its effectiveness. The scheme was successfully demonstrated by fabricating a prototype imager with 12-bit column-parallel ADCs. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
image sensor / Column Parallel ADC / Ramp ADC / Photon Shot Noise limited Characteristics / Accelerated Ramp Scheme / / / |
Reference Info. |
IEICE Tech. Rep., vol. 105, no. 185, ICD2005-61, pp. 35-38, July 2005. |
Paper # |
ICD2005-61 |
Date of Issue |
2005-07-08 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 |
Copyright and reproduction |
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Link to ES Tech. Rep. Archives: ICD2005-61 |
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