IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2005-07-14 10:45
Test flow path selection for QoS degradation point estimation from end-to-end flow quality information
Yohei Hasegawa, Masayoshi Kobayashi, Tutomu Murase (NEC Corp.)
Abstract (in Japanese) (See Japanese page) 
(in English) We have proposed a method which locates the QoS degradation by using end-to-end per flow quality information. The method makes use of the test-flows to maintain the accuracy of locating when the number of flows generated by the actual communications are not sufficient. Thus, it cannot achieve sufficient accuracy in the case that a small number of hosts are capable to generate test flows, or their locations are restricted, because of the difficulty to generate test flows passing through the desirable paths. Moreover, even if the test flow can always be generated for any path, we need to select a limited number of test flows not to burden the networks while keeping the accuracy of locating. In this paper, we propose to use test flow which has round trip path like ping so that plenty of paths are available. And we propose heuristic method for selecting test flow, which is aimed to reduce search cost of test flow. Simulation results show that the proposed method improved accuracy of the estimation by ten times greater than the original method. The proposed method also reduced cost of calculating test flow by 90%.
Keyword (in Japanese) (See Japanese page) 
(in English) network monitoring / QoS measurement / active measurement / network tomography / / / /  
Reference Info. IEICE Tech. Rep., vol. 105, no. 179, CQ2005-17, pp. 7-12, July 2005.
Paper # CQ2005-17 
Date of Issue 2005-07-07 (CQ) 
ISSN Print edition: ISSN 0913-5685
Download PDF

Conference Information
Committee CQ  
Conference Date 2005-07-14 - 2005-07-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Wakkanai Hokusei Gakuen College 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Contents/Security/Reliability/Mobile for Broadband and Broadcast, etc. 
Paper Information
Registration To CQ 
Conference Code 2005-07-CQ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Test flow path selection for QoS degradation point estimation from end-to-end flow quality information 
Sub Title (in English)  
Keyword(1) network monitoring  
Keyword(2) QoS measurement  
Keyword(3) active measurement  
Keyword(4) network tomography  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yohei Hasegawa  
1st Author's Affiliation NEC Corporation (NEC Corp.)
2nd Author's Name Masayoshi Kobayashi  
2nd Author's Affiliation NEC Corporation (NEC Corp.)
3rd Author's Name Tutomu Murase  
3rd Author's Affiliation NEC Corporation (NEC Corp.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2005-07-14 10:45:00 
Presentation Time 25 minutes 
Registration for CQ 
Paper # CQ2005-17 
Volume (vol) vol.105 
Number (no) no.179 
Page pp.7-12 
#Pages
Date of Issue 2005-07-07 (CQ) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan