Paper Abstract and Keywords |
Presentation |
2005-04-22 14:15
Study of accelerate test method for Optical components Yuichi Aoki, Yasutoshi Nakagawa (ESPEC) Link to ES Tech. Rep. Archives: CPM2005-4 OPE2005-4 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We performed the HAST for adhesive of optical components to compared with High temperature & High humidity test such as 85C85%. The activation energy was requested by using isolator. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
HAST / High Temperature High Humidity Test / adhesive / Isolator / Reliability / / / |
Reference Info. |
IEICE Tech. Rep., vol. 105, no. 26, R2005-4, pp. 17-20, April 2005. |
Paper # |
R2005-4 |
Date of Issue |
2005-04-15 (R, CPM, OPE) |
ISSN |
Print edition: ISSN 0913-5685 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
Link to ES Tech. Rep. Archives: CPM2005-4 OPE2005-4 |
Conference Information |
Committee |
OPE R CPM |
Conference Date |
2005-04-22 - 2005-04-22 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Packaging and reliability of optical componetns, etc. |
Paper Information |
Registration To |
R |
Conference Code |
2005-04-OPE-R-CPM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Study of accelerate test method for Optical components |
Sub Title (in English) |
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Keyword(1) |
HAST |
Keyword(2) |
High Temperature High Humidity Test |
Keyword(3) |
adhesive |
Keyword(4) |
Isolator |
Keyword(5) |
Reliability |
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Keyword(8) |
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1st Author's Name |
Yuichi Aoki |
1st Author's Affiliation |
ESPEC.CORP. (ESPEC) |
2nd Author's Name |
Yasutoshi Nakagawa |
2nd Author's Affiliation |
ESPEC.CORP. (ESPEC) |
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Speaker |
Author-1 |
Date Time |
2005-04-22 14:15:00 |
Presentation Time |
25 minutes |
Registration for |
R |
Paper # |
R2005-4, CPM2005-4, OPE2005-4 |
Volume (vol) |
vol.105 |
Number (no) |
no.26(R), no.27(CPM), no.28(OPE) |
Page |
pp.17-20 |
#Pages |
4 |
Date of Issue |
2005-04-15 (R, CPM, OPE) |
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