Paper Abstract and Keywords |
Presentation |
2005-04-15 14:30
New Development of Neutron-induced Soft-Error Simulation Technology Taiki Uemura, Yoshiharu Tosaka, Yoshio Ashizawa, Hideki Oka, Shigeo Satoh (Fujitsu lab.) Link to ES Tech. Rep. Archives: ICD2005-19 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In these years, the interest in soft error becomes increasing. This comes from the problem that the soft error occurs not only for memory circuits but also for logic circuits. The main origin of the soft error is neutron from secondary cosmic ray. Based on our developed simulation technology for the soft error by neutron, we extended it to describe the logic circuit’s soft error. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Soft Eror / Neutron / Logic / Memory / Reliability / Simulation / / |
Reference Info. |
IEICE Tech. Rep., vol. 105, no. 2, ICD2005-19, pp. 37-42, April 2005. |
Paper # |
ICD2005-19 |
Date of Issue |
2005-04-08 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
Link to ES Tech. Rep. Archives: ICD2005-19 |
Conference Information |
Committee |
ICD |
Conference Date |
2005-04-14 - 2005-04-15 |
Place (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
ICD |
Conference Code |
2005-04-ICD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
New Development of Neutron-induced Soft-Error Simulation Technology |
Sub Title (in English) |
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Keyword(1) |
Soft Eror |
Keyword(2) |
Neutron |
Keyword(3) |
Logic |
Keyword(4) |
Memory |
Keyword(5) |
Reliability |
Keyword(6) |
Simulation |
Keyword(7) |
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Keyword(8) |
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1st Author's Name |
Taiki Uemura |
1st Author's Affiliation |
Fujitsu Laboratories LTD (Fujitsu lab.) |
2nd Author's Name |
Yoshiharu Tosaka |
2nd Author's Affiliation |
Fujitsu Laboratories LTD (Fujitsu lab.) |
3rd Author's Name |
Yoshio Ashizawa |
3rd Author's Affiliation |
Fujitsu Laboratories LTD (Fujitsu lab.) |
4th Author's Name |
Hideki Oka |
4th Author's Affiliation |
Fujitsu Laboratories LTD (Fujitsu lab.) |
5th Author's Name |
Shigeo Satoh |
5th Author's Affiliation |
Fujitsu Laboratories LTD (Fujitsu lab.) |
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Speaker |
Author-1 |
Date Time |
2005-04-15 14:30:00 |
Presentation Time |
30 minutes |
Registration for |
ICD |
Paper # |
ICD2005-19 |
Volume (vol) |
vol.105 |
Number (no) |
no.2 |
Page |
pp.37-42 |
#Pages |
6 |
Date of Issue |
2005-04-08 (ICD) |