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Paper Abstract and Keywords
Presentation 2005-01-28 15:45
Learning-Based Improvement in Fault Tolerance of Hopfield Associative Memories
Naotake Kamiura, Teijiro Isokawa, Nobuyuki Matsui (Univ. of Hyogo) Link to ES Tech. Rep. Archives: CPM2004-172 ICD2004-217
Abstract (in Japanese) (See Japanese page) 
(in English) Hopfield neural networks tolerating weight faults are presented. The weight restriction and fault injection are adopted as fault-tolerant approaches. For the weight restriction, a range to which values of weights should belong is determined during the learning, and any weight being outside this range is forced to be either its upper limit or lower limit. A status of a fault occurring is then evoked by the fault injection, and calculating weights is made under this status. The learning based on both of the above approaches surpasses the learning based on either of them in the fault tolerance and/or in the learning time.
Keyword (in Japanese) (See Japanese page) 
(in English) Hopfield Associative Memories / Fault Tolerance / Fault Injection / Weight Restriction / Hebbian Learning / / /  
Reference Info. IEICE Tech. Rep., vol. 104, no. 629, ICD2004-217, pp. 59-64, Jan. 2005.
Paper # ICD2004-217 
Date of Issue 2005-01-21 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: CPM2004-172 ICD2004-217

Conference Information
Committee ICD CPM  
Conference Date 2005-01-27 - 2005-01-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2005-01-ICD-CPM 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Learning-Based Improvement in Fault Tolerance of Hopfield Associative Memories 
Sub Title (in English)  
Keyword(1) Hopfield Associative Memories  
Keyword(2) Fault Tolerance  
Keyword(3) Fault Injection  
Keyword(4) Weight Restriction  
Keyword(5) Hebbian Learning  
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1st Author's Name Naotake Kamiura  
1st Author's Affiliation University of Hyogo (Univ. of Hyogo)
2nd Author's Name Teijiro Isokawa  
2nd Author's Affiliation University of Hyogo (Univ. of Hyogo)
3rd Author's Name Nobuyuki Matsui  
3rd Author's Affiliation University of Hyogo (Univ. of Hyogo)
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Speaker
Date Time 2005-01-28 15:45:00 
Presentation Time 30 
Registration for ICD 
Paper # IEICE-CPM2004-172,IEICE-ICD2004-217 
Volume (vol) IEICE-104 
Number (no) no.627(CPM), no.629(ICD) 
Page pp.59-64 
#Pages IEICE-6 
Date of Issue IEICE-CPM-2005-01-21,IEICE-ICD-2005-01-21 


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