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Paper Abstract and Keywords
Presentation 2005-01-28 14:00
On Finding Don't Cares in Test Sequences for Sequential Circuits and Applications to Test Compaction and Power Reduction
Yoshinobu Higami (Ehime Univ.), Seiji Kajihara (Kyushu Inst. Tech.), Shin-ya Kobayashi, Yuzo Takamatsu (Ehime Univ.) Link to ES Tech. Rep. Archives: CPM2004-169 ICD2004-214
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents a method for finding don't cares in test sequences hile keeping the original stuck-at fault coverage. Here two method are proposed for obtaining as many don't cares as possible, based on the method that utilizes fault simulation. Moreover as applications of test sequences including don't cares, power reduction method and test compaction method are proposed. By using the methods together, short test sequences with low power dissipation can be obtained.
Keyword (in Japanese) (See Japanese page) 
(in English) Sequential circuit / Test sequence / Don't care values / Test compaction / Power reduction / / /  
Reference Info. IEICE Tech. Rep., vol. 104, no. 629, ICD2004-214, pp. 41-46, Jan. 2005.
Paper # ICD2004-214 
Date of Issue 2005-01-21 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: CPM2004-169 ICD2004-214

Conference Information
Committee ICD CPM  
Conference Date 2005-01-27 - 2005-01-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2005-01-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) On Finding Don't Cares in Test Sequences for Sequential Circuits and Applications to Test Compaction and Power Reduction 
Sub Title (in English)  
Keyword(1) Sequential circuit  
Keyword(2) Test sequence  
Keyword(3) Don't care values  
Keyword(4) Test compaction  
Keyword(5) Power reduction  
1st Author's Name Yoshinobu Higami  
1st Author's Affiliation Ehime University (Ehime Univ.)
2nd Author's Name Seiji Kajihara  
2nd Author's Affiliation Kyushu Institute of Tecnology (Kyushu Inst. Tech.)
3rd Author's Name Shin-ya Kobayashi  
3rd Author's Affiliation Ehime University (Ehime Univ.)
4th Author's Name Yuzo Takamatsu  
4th Author's Affiliation Ehime University (Ehime Univ.)
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Date Time 2005-01-28 14:00:00 
Presentation Time 30 
Registration for ICD 
Paper # IEICE-CPM2004-169,IEICE-ICD2004-214 
Volume (vol) IEICE-104 
Number (no) no.627(CPM), no.629(ICD) 
Page pp.41-46 
#Pages IEICE-6 
Date of Issue IEICE-CPM-2005-01-21,IEICE-ICD-2005-01-21 

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