IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2005-01-27 13:30
Evaluation of LVP observability in 90nm devices, and development of on-chip elements for LVP measurement
Junpei Nonaka, Shinichi Wada (NEC Electronics) Link to ES Tech. Rep. Archives: CPM2004-156 ICD2004-201
Abstract (in Japanese) (See Japanese page) 
(in English) For devices after 90nm generation, LVP measurement will be difficult, because transistor sizes are less than laser diffraction limited. In this study, we evaluated ease of LVP measurement for 90nm devices. We also considered relationship between voltage waveforms and LVP waveforms through LVP measurement and device simulation. For devices after 90nm, inserting on-chip elements for LVP measurement into circuit will ease LVP measurement. We propose a new element structure to ease LVP measurement, and evaluate it. As a result, LVP waveform amplitudes for the elements are 30-50% larger than those for the same size inverters. Ease of LVP measurement is improved by using the proposed structure.
Keyword (in Japanese) (See Japanese page) 
(in English) LVP / deep submicron / device simulation / observability / pad / / /  
Reference Info. IEICE Tech. Rep., vol. 104, no. 628, ICD2004-201, pp. 7-12, Jan. 2005.
Paper # ICD2004-201 
Date of Issue 2005-01-20 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: CPM2004-156 ICD2004-201

Conference Information
Committee ICD CPM  
Conference Date 2005-01-27 - 2005-01-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2005-01-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of LVP observability in 90nm devices, and development of on-chip elements for LVP measurement 
Sub Title (in English)  
Keyword(1) LVP  
Keyword(2) deep submicron  
Keyword(3) device simulation  
Keyword(4) observability  
Keyword(5) pad  
1st Author's Name Junpei Nonaka  
1st Author's Affiliation NEC Electronics Corporation (NEC Electronics)
2nd Author's Name Shinichi Wada  
2nd Author's Affiliation NEC Electronics Corporation (NEC Electronics)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2005-01-27 13:30:00 
Presentation Time 30 
Registration for ICD 
Paper # IEICE-CPM2004-156,IEICE-ICD2004-201 
Volume (vol) IEICE-104 
Number (no) no.626(CPM), no.628(ICD) 
Page pp.7-12 
#Pages IEICE-6 
Date of Issue IEICE-CPM-2005-01-20,IEICE-ICD-2005-01-20 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan