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Paper Abstract and Keywords
Presentation 2005-01-17 11:35
Suppression of radiation from microstrip stub by lossy chip
Yasuhiro Ohsumi, Nagayoshi Morita (Chiba Inst. of Tech.) Link to ES Tech. Rep. Archives: ED2004-206 MW2004-213
Abstract (in Japanese) (See Japanese page) 
(in English) Radiation from stubs such as open and radial stubs of microstrip lines has occasionally undesirable influence on the circuit characteristics or circumference environment. As one of the measures for preventing this influence an idea is available to attach some thin and small lossy chips near to the tip of stubs. It has not been investigated sufficiently whether this method actually works or not. In this report, the effect of this method is studied in detail by means of numerical simulation.
Keyword (in Japanese) (See Japanese page) 
(in English) microstrip / open stub / radial stub / FDTD method / / / /  
Reference Info. IEICE Tech. Rep., vol. 104, no. 551, MW2004-213, pp. 17-22, Jan. 2005.
Paper # MW2004-213 
Date of Issue 2005-01-10 (ED, MW) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: ED2004-206 MW2004-213

Conference Information
Committee MW ED  
Conference Date 2005-01-17 - 2005-01-18 
Place (in Japanese) (See Japanese page) 
Place (in English)  
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Paper Information
Registration To MW 
Conference Code 2005-01-MW-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Suppression of radiation from microstrip stub by lossy chip 
Sub Title (in English)  
Keyword(1) microstrip  
Keyword(2) open stub  
Keyword(3) radial stub  
Keyword(4) FDTD method  
1st Author's Name Yasuhiro Ohsumi  
1st Author's Affiliation Chiba Institute of Technology (Chiba Inst. of Tech.)
2nd Author's Name Nagayoshi Morita  
2nd Author's Affiliation Chiba Institute of Technology (Chiba Inst. of Tech.)
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Date Time 2005-01-17 11:35:00 
Presentation Time 25 
Registration for MW 
Paper # IEICE-ED2004-206,IEICE-MW2004-213 
Volume (vol) IEICE-104 
Number (no) no.549(ED), no.551(MW) 
Page pp.17-22 
#Pages IEICE-6 
Date of Issue IEICE-ED-2005-01-10,IEICE-MW-2005-01-10 

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