Paper Abstract and Keywords |
Presentation |
2004-12-10 16:15
A Study on Measurement of LSI Immunity for PCB Analysis Kouji Ichikawa, Yukihiko Sakurai, Masashi Inagaki, Takeshi Matsui (DENSO), Yuichi Mabuchi (Hitachi), Atsushi Nakamura, Toru Hayashi (Renesas Technology) |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We have been developing an LSI model for EMS simulation in automotive electronic control units.
PCB immunity was analyzed through the DPI method, one of EMI evaluation methods, using the EMS model of an LSI, the impedance of measurement system, and the voltage threshold level operation of the LSI at failure, and it was verified its usefulness and subject. The analysis were also applied to products and could be found useful, though there are some room for improvement in accuracy. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
EMS / Immunity / Direct RF Power Injection / LSI model / Simulation / / / |
Reference Info. |
IEICE Tech. Rep., vol. 104, no. 499, EMCJ2004-115, pp. 77-82, Dec. 2004. |
Paper # |
EMCJ2004-115 |
Date of Issue |
2004-12-03 (EMCJ) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
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