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Paper Abstract and Keywords
Presentation 2004-11-08 13:30
A twist technique based on third power residue and non residue
Yoshito Hidaka, Mayumi Obara, Yasuyuki Nogami, Yoshitaka Morikawa (Okayama Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) In this paper, we propose a twist technique based on third power residue and non residue. In addition,with the conventional twist technique, we consider the six curves. We show a relation of these curves and the
conditions such that they are not super-singular curves.
Keyword (in Japanese) (See Japanese page) 
(in English) elliptic curve / twist / third power residue/non-residue / / / / /  
Reference Info. IEICE Tech. Rep., vol. 104, no. 421, ISEC2004-78, pp. 1-6, Nov. 2004.
Paper # ISEC2004-78 
Date of Issue 2004-11-01 (ISEC, OIS) 
ISSN Print edition: ISSN 0913-5685
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Conference Information
Committee ISEC LOIS  
Conference Date 2004-11-08 - 2004-11-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Osaka Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ISEC 
Conference Code 2004-11-ISEC-OIS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A twist technique based on third power residue and non residue 
Sub Title (in English)  
Keyword(1) elliptic curve  
Keyword(2) twist  
Keyword(3) third power residue/non-residue  
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1st Author's Name Yoshito Hidaka  
1st Author's Affiliation Okayama University (Okayama Univ.)
2nd Author's Name Mayumi Obara  
2nd Author's Affiliation Okayama University (Okayama Univ.)
3rd Author's Name Yasuyuki Nogami  
3rd Author's Affiliation Okayama University (Okayama Univ.)
4th Author's Name Yoshitaka Morikawa  
4th Author's Affiliation Okayama University (Okayama Univ.)
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Speaker Author-1 
Date Time 2004-11-08 13:30:00 
Presentation Time 25 minutes 
Registration for ISEC 
Paper # ISEC2004-78, OIS2004-45 
Volume (vol) vol.104 
Number (no) no.421(ISEC), no.423(OIS) 
Page pp.1-6 
#Pages
Date of Issue 2004-11-01 (ISEC, OIS) 


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