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  1. ŒÃ’J�FºÝËß­°À¥¼½ÃÑ ‚Ì�M—Š�«Œü�ã,IEICE‹Z•ñ R100-525,�m�V̪۰“Á•Ê�u‰‰�n(SSS2000-33),
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  2. M.Furuya: Studies of Systems Reliability Growth by the Analysis on Decreasing Rate of Unavailability,
    IEICE Trans.on Fundamentals of Electronics,Communication & Computer Science,
    E77-A-1,1994-1,117-121.


  3. ŒÃ’J: ¼½ÃÑ�M—Š�«�¬’·‚Ì’Ç�Õ‚É‚æ‚é•Û‘S�«Œü�ãŽÀ�Ñ•]‰¿, �M—Š�« 15-1[�M—Š�«Šw‰ïŽ�],
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