Fault Diagnosis for Logic Circuits-Development of Methods for Identifying Fanlt Locations Based on output Responses |
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Yuzo Takamatsu ・ Hiroshi takahashi ・ Yoshinobu Higami ・ Yasuo Sato |
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Koji Yamazaki |
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| The Best Paper Award | |||||
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| This survey paper is clearly described for wide readers until the latest technology from basic technology. As the speed as well as the density of LSIs rapidly increases due to the progress of the technology, fault diagnosis is getting more important. The purpose of fault diagnosis is to improve (1) the quality of LSIs by analyzing the cause of physical defects in faulty LSIs, (2) the yield by analyzing the defects or bugs on manufacturing process. In this paper they survey the papers on fault diagnosis for logic circuits. First, they briefly describe fault models, effect-cause analysis and cause-effect analysis, which are basic concepts on fault diagnosis. Next they explain fault diagnosis methods dealing with various fault models in two categories: "Logic-based diagnosis" and "Defect-based diagnosis." This paper includes the recent researches on logic-based fault diagnosis for single stuck-at faults, multiple stuck-at faults, bridging faults, open faults and X-modeled faults and defect-based fault diagnosis for bridging faults, open faults and intra-cell faults. | |||||
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