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Teruoki Kitajima, Akira Yachidate, Fujihiko Matsumoto and Yasuaki Noguchi,
"A Technique to improve linearity deterioreted by mobility degradation for an MOS transconductor,"
IEICE Tech. Rep., CS2005-121, pp. 61-66, March 2006.

Report Number: CS2005-121, CAS2005-128, SIP2005-174

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The abbreviation of author's names was made automatically. Please confirm them before you cut and paste.

\bibitem{cs2005-121}
Teruoki~Kitajima, Akira~Yachidate, Fujihiko~Matsumoto and Yasuaki~Noguchi,
``A Technique to improve linearity deterioreted by mobility degradation for an MOS transconductor,''
{\em IEICE Tech. Rep.}, CS2005-121, pp.~61-66, March 2006.

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