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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2020-11-20
10:30		 Online Online [Invited Talk] Power Device Degradation Estimation by Machine Learning of Gate Waveforms
Hiromu Yamasaki, Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Takayasu Sakurai, Makoto Takamiya (Univ. of Tokyo) SDM2020-29		 A method to detect bonding wire lift-off of SiC MOSFETs using machine learning from the gate voltage waveform is propose... [more] SDM2020-29
pp.32-35
NLP 2016-09-14
11:20		 Hyogo Konan Univ. Model identification and stabilization of propagating wave segments in the Oregonator model
Hisatoshi Katsumata, Yang Lo, Keiji Konishi, Naoyuki Hara (Osaka Pref Univ.) NLP2016-46		 This report deals with stabilization of propagating wave segments in an excitable medium. In our previous study [Katsuma... [more] NLP2016-46
pp.9-14
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