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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ISEC 2013-12-11
14:55
Tokyo Kikai-Shinko-Kaikan Bldg. The Process by which Faults are Injected on Smart Cards Attacked by an Electromagnetic Irradiation Experiment
Yuu Tsuchiya, Hitoshi Ono, Tsutomu Matsumoto (Yokohama National Univ.) ISEC2013-77
Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been conside... [more] ISEC2013-77
pp.25-31
IT, ISEC, WBS 2013-03-08
10:30
Osaka Kwansei Gakuin Univ., Osaka-Umeda Campus Laser Fault Injection Attack on Non-Decapped Contact Smart Card
Hitoshi Ono, Yuu Tsuchiya, Tsuyoshi Toyama, Takeshi Kishikawa, Shohei Saito (Yokohama National Univ.), Akihiko Sasaki (MORITA TECH), Akashi Satoh (Univ. of Tokyo), Tsutomu Matsumoto (Yokohama National Univ.) IT2012-93 ISEC2012-111 WBS2012-79
 [more] IT2012-93 ISEC2012-111 WBS2012-79
pp.195-202
ISEC 2012-12-12
14:55
Tokyo Kikai-Shinko-Kaikan Bldg. The YNU's Method for Acquiring Power-Consumption Traces Developed for DPA Contest v3
Tsutomu Matsumoto, Takeshi Kishikawa, Hitoshi Ono, Shohei Saito, Yuu Tsuchiya (Yokohama Nat'l Univ.), Akihiko Sasaki (MORITA TECH), Tsuyoshi Toyama (Yokohama Nat'l Univ.) ISEC2012-76
 [more] ISEC2012-76
pp.29-36
EMD 2012-11-30
10:45
Chiba Chiba Institute of Technology Arc Length of Break Arcs Magnetically Blown-out at Arc Extinction
Hitoshi Ono, Junya Sekikawa (Shizuoka Univ.) EMD2012-66
Silver electrical contacts are separated at constant speed and break arcs are generated in a DC300V-450V/10A resistive c... [more] EMD2012-66
pp.13-18
EMCJ, EMD 2012-07-20
13:40
Tokyo Kikai-Shinko-Kaikan Bldg. Magnetically Blowing out of Break Arcs Restricted by the Wall
Hitoshi Ono, Junya Sekikawa (Shizuoka Univ) EMCJ2012-43 EMD2012-18
Silver contacts are separated at constant speed and break arc are generated in a DC200-450V and 10A resistive circuit. T... [more] EMCJ2012-43 EMD2012-18
pp.13-18
EMD 2011-11-17
08:45
Akita Akita Univ. Tegata Campus Reignition of Break Arcs Magnetically Blown-Out in a 450V DC Resistive Circuit
Hitoshi Ono, Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ) EMD2011-66
Silver electrical contacts are separated at constant speed and break arc are generated in a DC450V-10A resistive circuit... [more] EMD2011-66
pp.1-6
EMD, EMCJ 2011-07-15
13:10
Tokyo Kikai-Shinko-Kaikan Bldg. Time evolution of gap voltage just before arc extinction of break arcs driven by transverse magnetic field in a DC high-voltage circuit
Hitoshi Ono, Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ) EMCJ2011-63 EMD2011-22
 [more] EMCJ2011-63 EMD2011-22
pp.13-18
AP 2007-10-19
13:25
Aomori Hirosaki Univ. Consideration on Scattering Model Decomposition by using ESPRIT method for Pol-InSAR Imaging
Hitoshi Onoda, Hiroyoshi Yamada, Yoshio Yamaguchi (Niigata Univ) AP2007-99
In recent years, the microwave remote sensing draw the attention as a means to observe the large ground surface area. In... [more] AP2007-99
pp.69-74
 Results 1 - 8 of 8  /   
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