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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| R | 2022-12-15 15:45 |
Online | Online | The trends of IEC/TC 56 Dependability Ko Kawashima (ORIENTAL MOTOR), Yoshinobu Sato (Institute for Healthcare Quality Improvement), Yoshiki Kinoshita (Kanagawa Univ.), Hiroyuki Goto (D.SS), Akihiko Masuda (Reliability Seven Tools (R7) Practice Studio), Shigeru Yanagi (National Defense Academy), Makoto Takeyama (Kanagawa Univ.), Tadahiro Shibutani (Yokohama National Univ.)  R2022-47 |
IEC/TC 56 is in charge of developing and revising international dependability standards related horizontally to both of ... [more] | R2022-47 pp.19-24 |
| EMD, R | 2020-02-14 13:35 |
Shizuoka | Trend on standardization of Dependability
-- Outline of IEC TC 56 2016 Sydney international meeting and drafts from Japan -- Hiroyuki Goto (FDK), Yoshinobu Sato (The IHQI, Tokyo Healthcare Foundation), Fumiaki Harada (D-Tech Partners), Yoshiki Kinoshita (Kanagawa University) R2019-54 EMD2019-54 |
IEC/TC 56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Shanghai, China... [more] | R2019-54 EMD2019-54 pp.1-6 |
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| NS | 2018-04-19 14:50 |
Fukuoka | Fukuoka Univ. | [Invited Talk]
QUIC technology and standardization status Hiroyuki Goto (Gree) NS2018-5 |
(To be available after the conference date) [more] | NS2018-5 pp.25-30 |
| R | 2017-12-15 15:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | R2017-60 |
Plenary meeting of IEC TC 56 “Dependability” was held in Tokyo this year. Firstly, Mr. Mori (METI) welcomed the TC 56 an... [more] | R2017-60 pp.25-30 |
| CCS | 2017-06-30 12:05 |
Ibaraki | Ibaraki Univ. | Anomaly Detection of Hardly Predictable Systems by Autoencoder
-- Trading Strategy Foreseeing Modification of Abnormal Stock Prices -- Hiroyuki Gotou, Tomoya Suzuki (Ibaraki Univ.) CCS2017-8 |
For anomaly detection in time-series data, it is common to compose a prediction model trained by historical data and inv... [more] | CCS2017-8 pp.35-40 |
| R | 2016-12-16 14:15 |
Kanagawa | Maholoba Minds Miura (Miura City, Kanagawa Prefecture) | Trend on standardization of dependability
-- Outline of IEC TC56 2016 Sydney international meeting and drafts from Japan -- Hiroyuki Goto (FDK), Yoshinobu Sato (JACO), Yoshiki Kinoshita (KU) R2016-54 |
IEC/TC 56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Sydney, Austral... [more] | R2016-54 pp.1-6 |
| CCS | 2016-08-09 16:30 |
Hokkaido | Yoichi Chuo kominkan | Abnormal Stock Price Movements Detected on the Network of Interacting Stocks Tomoya Suzuki, Hiroyuki Goto, Tokimaru Tsuruta, Hiroya Koizumi (Ibaraki Univ.) CCS2016-19 |
To detect abnormal price jumps of financial markets, some indicators based on the volatility have been used such as the ... [more] | CCS2016-19 pp.15-20 |
| R | 2016-07-29 15:20 |
Hokkaido | Otaru Chamber of Commerce and Industry | Trend of reliability test term in JIS Z 8115 draft revision considering the integrity of the IEC 60050-192 Dependability Akihiko Masuda (R7 Studio), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor), Fumiaki Harada (FXAT) R2016-17 |
[more] | R2016-17 pp.25-30 |
| EMD, R | 2016-02-19 15:35 |
Shizuoka | Azarea,Shizuoka | Latest Trends of JIS Z8115 DependabilityTerminology amendment drafts
-- Focus on relevant terms of failure and fault -- Fumiaki Harada (FXAT), AKihiko Masuda (R7 Studio), Tateki NIsh (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor) R2015-70 EMD2015-98 |
[more] | R2015-70 EMD2015-98 pp.31-36 |
| R | 2015-07-31 16:35 |
Aomori | Latest trends of JIS reliability design and analysis terminology
-- Comparison with JIS Z 8115 amendment drafts and IEC 60050-192 first edition -- Akihiko Masuda (R7 Studio), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental Motor), Fumiaki Harada (FXAT) R2015-21 |
Dependability (reliability) terms of IEC 60050-192 standard was enacted in February 2015. It has passed 25 years since t... [more] | R2015-21 pp.43-48 |
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| R | 2014-12-19 15:00 |
Tokyo | Aims and Key Issues of the Revision of JIS Z 8115 Dependability (Reliability) Terms -Part 2- Ko Kawashima (ORIENTAL MOTOR), Akihiko Masuda (Tokyo Univ. of Science), Tateki Nishi (DNV GL Business Assurance Japan), Hiroyuki Goto (FDK) R2014-69 |
The revision of JIS Z 8115:2000 Glossary of Used in Dependability is proceeded. In this revision, some terms and defini... [more] |
R2014-69 pp.25-28 |
|
| R | 2014-12-19 15:25 |
Tokyo | Trend on standardization of dependability
-- Outline of IEC TC56 and agenda on international meeting -- Hiroyuki Goto (FDK), Yoshinobu Sato (JACO), Yoshiki Kinoshita, Makoto Takeyama (KU) R2014-70 |
IEC/TC56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Prague, Czech Re... [more] | R2014-70 pp.29-34 |
|
| R | 2014-08-01 15:45 |
Hokkaido | Smile Hotel Hakodate | Aims and Key Issues of the Amendment of JIS Z 8115 Dependability (Reliability) Terms (Part 1) Akihiko Masuda (Tokyo Univ. of Science), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental Motor) R2014-19 |
Since JIS Z 8115 standard of reliability term was revised in 2000, 14 years have passed. There was the existence of the ... [more] | R2014-19 pp.31-36 |
| WBS, MICT (Joint) |
2013-07-10 10:55 |
Kochi | [Special Talk]
Wearable Dual Band Antenna for BAN Use Hisao Iwasaki, Hiroyuki Goto, Hiroyuki Sugiyama (SIT) |
For the purpose of medical support and health care, BAN technology attracts attention mainly in the field of medical ICT... [more] | ||
| R | 2012-12-14 11:15 |
Tokyo | Trend on standardization of dependability
-- Outline of IEC TC56 and agenda on international meeting -- Fumiaki Harada (FXAT), Hiroyuki Gotoh (FUJITSU), Hiroki Takamura (JST), Yoshiki Kinoshita, Makoto Takeyama (AIST) R2012-71 |
[more] | R2012-71 pp.19-26 |
|
| MWP, OPE, MW, EMT, EST, IEE-EMT [detail] | 2012-07-27 11:20 |
Hokkaido | Hokkaido Univ. | A study on topology optimization based on function expansion method for dispersion property Hiroyuki Goto, Yasuhide Tsuji (Muroran Inst. Tech.), Takashi Yasui, Koichi Hirayama (Kitami Inst. Tech) MW2012-62 OPE2012-55 EST2012-44 MWP2012-43 |
In this paper, the topology optimization based on function expansion method is employed to the optimization of the dispe... [more] | MW2012-62 OPE2012-55 EST2012-44 MWP2012-43 pp.215-219 |
| R | 2011-12-16 13:00 |
Tokyo | Trend on standardization of dependability
-- Outline of IEC TC56 and agenda on international meeting -- Fumiaki Harada (FXAT), Hiroyuki Gotoh (FUJITSU), Hiroki Takamura (JST), Yoshiki Kinoshita, Makoto Takeyama (AIST) R2011-37 |
[more] | R2011-37 pp.1-7 |
|
| IA, ICSS | 2009-06-19 13:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Key escrow method of personal decryptographic key by using elliptic curve caliculation Michiko Harayama, Kouji Sakai, Hiroyuki Goto (Gifu Univ.) IA2009-17 ICSS2009-25 |
[more] | IA2009-17 ICSS2009-25 pp.91-96 |
| LOIS, IN, ICM | 2005-01-21 14:00 |
Fukuoka | Fukuoka Institute of Technology | A diagramming tool of the conversation for communication support Kazuhiro Ninomiya, Yoshitaka Fujiwara, Shin-ichirou Okada (Kitami IT), Hiroyuki Gotoh (RICOH SYSTEM KAIHATU) |
[more] | IN2004-168 TM2004-91 OIS2004-89 pp.37-42 |
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