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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-06 14:55 |
Kumamoto |
Kumamoto-Kenminkouryukan Parea |
An Approach to Selection of Classifiers and their Thresholds for Machine Learning Based Fail Chip Prediction Daichi Yuruki, Satoshi Ohtake (Oita Univ), Yoshiyuki Nakamura (Renesas Electronics) VLD2017-36 DC2017-42 |
Today, semiconductor technologies have developed and advance the integration density of LSI circuits.
A technique which... [more] |
VLD2017-36 DC2017-42 pp.55-60 |
DC |
2017-02-21 12:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
An Approach to Performance Improvement of Machine Learning Based Fail Chip Discrimination Daichi Yuruki, Satoshi Ohtake (Oita Univ), Yoshiyuki Nakamura (Renesas System Design) DC2016-77 |
Today, advancements of semiconductor technology have progress to high integration of LSI circuits.
A technique which ke... [more] |
DC2016-77 pp.17-22 |
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