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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| LQE, EST, OPE, EMT, PN, MWP, IEE-EMT, PEM [detail] |
2016-01-28
14:45 |
Hyogo |
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Nearfield Magnetic Sensing Equipment by the method of magneto-optics crystal sensing
Kenichi Kamijo, Yasuhiro Hata (MORITA TECH), Kunihiko Hidaka (University of Tokyo), Shinichiro Mito (TNCT) |
[more] |
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| IT, ISEC, WBS |
2013-03-08
10:30 |
Osaka |
Kwansei Gakuin Univ., Osaka-Umeda Campus |
Laser Fault Injection Attack on Non-Decapped Contact Smart Card
Hitoshi Ono, Yuu Tsuchiya, Tsuyoshi Toyama, Takeshi Kishikawa, Shohei Saito (Yokohama National Univ.), Akihiko Sasaki (MORITA TECH), Akashi Satoh (Univ. of Tokyo), Tsutomu Matsumoto (Yokohama National Univ.)  IT2012-93 ISEC2012-111 WBS2012-79 |
[more] |
IT2012-93 ISEC2012-111 WBS2012-79
pp.195-202 |
| ISEC |
2012-12-12
14:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
The YNU's Method for Acquiring Power-Consumption Traces Developed for DPA Contest v3
Tsutomu Matsumoto, Takeshi Kishikawa, Hitoshi Ono, Shohei Saito, Yuu Tsuchiya (Yokohama Nat'l Univ.), Akihiko Sasaki (MORITA TECH), Tsuyoshi Toyama (Yokohama Nat'l Univ.) ISEC2012-76 |
[more] |
ISEC2012-76
pp.29-36 |
| ISEC, LOIS |
2012-11-21
14:15 |
Shizuoka |
Shizuoka City Industry-University Exchange Center |
How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromaginetic Irradiataion
Yuu Tsuchiya, Takeshi Kishikawa, Shohei Saito, Tsuyoshi Toyama (YNU), Akihiko Sasaki (MORITA TECH), Akashi Satoh (VDEC, Univ. Tokyo), Tsutomu Matsumoto (YNU) ISEC2012-57 LOIS2012-32 |
Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been conside... [more] |
ISEC2012-57 LOIS2012-32
pp.1-8 |
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