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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2020-02-26 10:50 |
Tokyo | A study on temperature dependence on discrimination of resistive opens using machine learning-based anomaly detection Ryotaroh Nakanishi, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.)  DC2019-88 |
[more] | DC2019-88 pp.13-18 |
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| DC | 2020-02-26 11:35 |
Tokyo | Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) DC2019-89 |
For guaranteeing the functional safety of an in-vehicle system, a power-on self-test (POST) is required to test the devi... [more] | DC2019-89 pp.19-24 |
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| DC | 2019-12-20 15:40 |
Wakayama | Study on Condition-Based Maintenance of Railway Signal Equipment using the Machine Learning Hiroshi Shida (JR West), Akihiro Tamura, Takashi Ninomiya, Hiroshi Takahashi (Ehime Univ) DC2019-83 |
Dependable systems are required high safety and reliability. Recently, condition-based maintenance(CBM) is expected to m... [more] | DC2019-83 pp.25-30 |
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| MWP | 2019-11-27 13:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | RF signal phase shift method by means of optical phase control in RoF transmission Hiroshi Takahashi (Sophia Univ.) MWP2019-42 |
A new technique is proposed to enable phase shift of microwave or millimeter wave emitted from antenna at the end of RoF... [more] | MWP2019-42 pp.1-4 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 16:10 |
Ehime | Ehime Prefecture Gender Equality Center | Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2019-45 DC2019-69 |
In order to ensure the functional safety of advanced autonomous driving systems, a power-on self-test (POST) is require... [more] |
VLD2019-45 DC2019-69 pp.145-150 |
| DC | 2019-02-27 11:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A built-in self-diagnosis mechanism based on self-generation of expected signatures Yushiro Hiramoto, Satoshi Ohtake (Oita Univ.), Hiroshi Takahashi (Ehime Univ.) DC2018-76 |
[more] | DC2018-76 pp.31-36 |
| DC | 2019-02-27 14:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79 |
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] | DC2018-79 pp.49-54 |
| OCS, OFT, LSJ (Joint) [detail] |
2018-08-30 14:30 |
Hokkaido | Hakodate Hokuyo Building 8Kai Hall | Investigation on Cross-sectional Brillouin Gain depending on the Electric Field Distribution Tomokazu Oda (NTT), Hiroshi Takahashi (NTT East), Kunihiro Toge, Tetsuya Manabe (NTT) OFT2018-6 |
Mode division multiplexing technique has been intensively studied for realization of large capacity optical communicatio... [more] | OFT2018-6 pp.1-4 |
| DC | 2018-02-20 16:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Testing the Bridge Interconnect Fault for Memory based Reconfigurable Logic Device (MRLD) Senling Wang, Tatsuya Ogawa, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Masayuki Sato, Mitsunori Katsu (TRL), Shoichi Sekiguchi (TAIYOYUDEN) DC2017-87 |
MRLD is a promising alternative to FPGA with the benefits of low production cost, low power and small delay. In order to... [more] | DC2017-87 pp.61-66 |
| OFT, OCS, LSJ (Joint) [detail] |
2017-08-31 13:15 |
Hokkaido | Hokkaido Univ. | Single-way Inter-modal Crosstalk Distribution Measurement in Spliced FMFs based on Stimulated Brillouin Scattering Hiroshi Takahashi, Chihiro Kito, Kunihiro Toge, Tetsuya Manabe (NTT), Fumihiko Ito (Shimane Univ.) OFT2017-24 |
A space division multiplexing (SDM) transmission system has been intensively studied for large capacity optical communic... [more] | OFT2017-24 pp.1-4 |
| OFT, OCS, LSJ (Joint) [detail] |
2017-09-01 10:25 |
Hokkaido | Hokkaido Univ. | Development of photonic crystal components for coherent communication Shojiro Kawakami, Takayuki Kawashima, Takafumi Chiba, Toshikazu Ijiro (PhL), Hiroyuki Tsuda (Keio Univ.), Hiroshi Takahashi (Sophia Univ.) OCS2017-30 |
(Advance abstract in Japanese is available) [more] | OCS2017-30 pp.39-44 |
| OFT | 2017-05-25 14:30 |
Shimane | Shimane Univ. (Matsue campus) | Simplified and high speed BOTDA employing frequency-swept pulses Chihiro Kito, Hiroshi Takahashi, Kunihiro Toge, Tetsuya Manabe (NTT) OFT2017-2 |
In recent years, research on optical measurement technology using Brillouin scattering capable of measuring temperature ... [more] | OFT2017-2 pp.7-10 |
| ICD | 2017-04-21 14:15 |
Tokyo | [Invited Talk]
A 1/2.3in 20Mpixel 3-Layer Stacked CMOS Image Sensor with DRAM Tsutomu Haruta, Tsutomu Nakajima, Jun Hashizume, Taku Umebayashi, Hiroshi Takahashi, Kazuo Taniguchi, Masami Kuroda, Hiroshi Sumihiro, Koji Enoki (Sony Semiconductor Solutions), Takatsugu Yamasaki (Sony Semiconductor Manufacturing), Katsuya Ikezawa, Atsushi Kitahara, Masao Zen, Masafumi Oyama, Hiroki Koga (Sony Semiconductor Solutions) ICD2017-18 |
[more] | ICD2017-18 pp.95-98 |
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| DC | 2017-02-21 11:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Built-In Self Diagnosis Architecture for Logic Design Keisuke Kagawa, Fumiya Yano, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Satoshi Ohtake (Oita Univ.) DC2016-76 |
Recently, roles of automotive LSI to realize a functional safety of vehicle are increasing. In order to guarantee the fu... [more] | DC2016-76 pp.11-16 |
| DC | 2017-02-21 16:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Design for Evaluation of TSV based Interconnections in 3D-SIC
-- Interconnection Resistance Evaluation with Analog Boundary Scan -- Shuichi Kameyama (Ehime Univ./Fujitsu), Senling Wang, Hiroshi Takahashi (Ehime Univ.) DC2016-83 |
This paper introduces a concept of Design for Evaluation (DFE) that is a design method to embed circuits for quality eva... [more] | DC2016-83 pp.53-58 |
| OCS, OFT, OPE (Joint) [detail] |
2017-02-17 10:45 |
Osaka | Osaka Prefecture University(I-site Nanba) | Transient Dynamics of Brillouin Acoustic Wave on Frequency Swept Pulse for Fiber Loss Monitoring Hiroshi Takahashi, Kunihiro Toge, Chihiro Kito, Manabe Tetsuya (NTT) OFT2016-52 OPE2016-169 |
We have proposed pulsed pump-probe Brillouin optical time domain analysis (ERA-BOTDA) for optical fiber loss measurement... [more] | OFT2016-52 OPE2016-169 pp.39-44(OFT), pp.49-54(OPE) |
| OFT, OCS, IEE-CMN, ITE-BCT [detail] | 2016-11-11 13:10 |
Nagasaki | Nagasaki Shoko Kaigi Sho | Brillouin dynamic strain measurement employing frequency-swept pulses Chihiro Kito, Hiroshi Takahashi, Kunihiro Toge, Tetsuya Manabe (NTT) OFT2016-32 |
Recently, a lot of Brillouin-based fast sensing schemes were reported aiming to apply to social structure health monitor... [more] | OFT2016-32 pp.41-44 |
| SCE | 2016-04-20 16:10 |
Tokyo | High Speed Tunable Superconducting Filter Hiroaki Ikeuchi, Tamio Kawaguchi, Noritsugu Shiokawa, Junya Tanaka, Rie Katsuki, Hiroshi Takahashi, Hiroyuki Kayano (Toshiba) SCE2016-8 |
We propose a high speed tunable superconducting filter with a new dielectric drive mechanism. The bandpass filter is use... [more] | SCE2016-8 pp.43-48 |
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| DC | 2016-02-17 10:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Reduction of open fault test pattern generation time by selection of adjacent lines for assigning logic value Kazui Fujitnai, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2015-88 |
As semiconductor technology is scaling down, open defects have often occurred at interconnect lines and vias. If logic v... [more] | DC2015-88 pp.13-18 |
| DC | 2016-02-17 15:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Analog Circuit Design for a Precision Resistance Measurement of TSVs Senling Wang, Keisuke Kagawa (Ehime Univ.), Shuichi Kameyama (Fujitsu), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2015-94 |
[more] | DC2015-94 pp.49-54 |
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