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Technical Committee on Integrated Circuits and Devices (ICD)  (Searched in: 2010)

Search Results: Keywords 'from:2010-12-16 to:2010-12-16'

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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 21 - 34 of 34 [Previous]  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2010-12-16
15:10
Tokyo RCAST, Univ. of Tokyo [Poster Presentation] Design of An FU Network for Array Accelerators
Suguru Ooue, Takuya Iwakami, Kazuhiro Yoshimura, Takashi Nakada, Yasuhiko Nakashima (NAIST) ICD2010-115
We have proposed Linear Array Pipeline Processor (LAPP) as a special implementation of Function Unit (FU) array based ac... [more] ICD2010-115
pp.97-99
ICD 2010-12-16
15:10
Tokyo RCAST, Univ. of Tokyo [Poster Presentation] On-chip immunoassay by a standard CMOS chip
Jaesung Lee (Hiroshima Univ.), Koh Johguchi (Univ. of Tokyo), Fumie Kaneko (Astellas), Tomohiro Ishikawa (Hiroshima Univ.) ICD2010-116
Aiming an immunoassay application, a standard CMOS chip which actuates dispersed magnetic beads was designed and fabrica... [more] ICD2010-116
pp.101-105
ICD 2010-12-17
09:30
Tokyo RCAST, Univ. of Tokyo [Invited Talk] Time Difference Amplifier, from Getting Idea to Presenting at a Conference
Toru Nakura (Univ. of Tokyo) ICD2010-117
 [more] ICD2010-117
pp.107-111
ICD 2010-12-17
10:20
Tokyo RCAST, Univ. of Tokyo Low Power and Highly Reliable Ferroelectric (Fe)-NAND Flash Memory for Enterprise SSD
Teruyoshi Hatanaka, Ryoji Yajima, Shinji Noda (Univ. of Tokyo), Mitsue Takahashi, Shigeki Sakai (AIST), Ken Takeuchi (Univ. of Tokyo) ICD2010-118
This paper proposes the techniques for highly reliable ferroelectric(Fe)-NAND flash memory. Fe-NAND has the low program/... [more] ICD2010-118
pp.113-118
ICD 2010-12-17
10:55
Tokyo RCAST, Univ. of Tokyo Development of Procedure for Modeling MOSFET Compatible with ITRS -- Noise and I-V Characteristics Modeling for RF/Analog MOSFET --
Sin-Nyoung Kim, Akira Tsuchiya, Hidetoshi Onodera (Kyoto Univ.) ICD2010-119
A procedure for modeling MOSFET compatible with ITRS is proposed. Compared to the PTM, this work focuses on how to gener... [more] ICD2010-119
pp.119-123
ICD 2010-12-17
11:20
Tokyo RCAST, Univ. of Tokyo A Charge-Domain Auto- and Cross-Correlation Based IR-UWB Receiver with Power- and Area-efficient PLL for 62.5ps Step Data Synchronization in 65nm CMOS
Lechang Liu, Takayasu Sakurai, Makoto Takamiya (Univ. of Tokyo) ICD2010-120
A 100Mb/s, 1.71mW DC-960MHz band impulse radio ultra-wideband (IR-UWB) receiver is developed in 1.2V 65nm CMOS. A novel ... [more] ICD2010-120
pp.125-129
ICD 2010-12-17
13:00
Tokyo RCAST, Univ. of Tokyo [Invited Talk] Variability in Scaled MOS Devices
Kiyoshi Takeuchi (Renesas) ICD2010-121
 [more] ICD2010-121
pp.131-133
ICD 2010-12-17
13:50
Tokyo RCAST, Univ. of Tokyo Misleading Energy and Performance Claims in Sub/Near Threshold Digital Systems
Yu Pu, Xin Zhang, Jim Huang (Univ. of Tokyo), Atsushi Muramatsu, Masahiro Nomura, Koji Hirairi, Hidehiro Takata, Taro Sakurabayashi, Shinji Miyano (STARC), Makoto Takamiya, Takayasu Sakurai (Univ. of Tokyo) ICD2010-122
Many of us in the field of ultra-low-Vdd processors experience difficulty in assessing the sub/near threshold circuit te... [more] ICD2010-122
pp.135-140
ICD 2010-12-17
14:15
Tokyo RCAST, Univ. of Tokyo Fine Grained Time Sharing to Extend Capacity of FU Array
Takuya Iwakami, Kazuhiro Yoshimura, Kodai Mori, Takashi Nakada, Yasuhiko Nakashima (NAIST) ICD2010-123
We have proposed Linear Array Pipeline Processor (LAPP) which can map popular VLIW codes onto
FU array and execute them... [more]
ICD2010-123
pp.141-146
ICD 2010-12-17
14:50
Tokyo RCAST, Univ. of Tokyo Comparison of the Error Correction Methods for SSDs and Dynamic Codeword Transition ECC Scheme
Shuhei Tanakamaru (Univ. of Tokyo), Atsushi Esumi, Mitsuyoshi Ito, Kai Li (SIGLEAD), Ken Takeuchi (Univ. of Tokyo) ICD2010-124
This paper compares error correcting codes (ECC) such as RS code and BCH code as an ECC for SSDs and introduces dynamic ... [more] ICD2010-124
pp.147-152
ICD 2010-12-17
15:15
Tokyo RCAST, Univ. of Tokyo A Circuit Partitioning Strategy for 3-D Integrated Multipliers
Kazuhito Sakai, Jubee Tada (Yamagata Univ.), Ryusuke Egawa, Hiroaki Kobayashi (Tohoku Univ.), Gensuke Goto (Yamagata Univ.) ICD2010-125
Three-dimensional(3-D) integration technologies attract a lot of attention to further enhance the performance of the LSI... [more] ICD2010-125
pp.153-158
ICD 2010-12-17
15:40
Tokyo RCAST, Univ. of Tokyo Design of a Low Error LUT-based Truncated Multiplier
Van-Phuc Hoang, Cong-Kha Pham (Univ. of Electro-comm.) ICD2010-126
Truncated multiplication is an efficient method to reduce area and power consumption of multipliers in signal processing... [more] ICD2010-126
pp.159-162
ICD 2010-12-17
16:15
Tokyo RCAST, Univ. of Tokyo A 1-V Input, 0.2-V to 0.47-V Output Switched-Capacitor DC-DC Converter with Pulse Density and Width Modulation (PDWM) for 57% Ripple Reduction
Xin Zhang, Yu Pu, Koichi Ishida (Univ. of Tokyo), Yoshikatsu Ryu, Yasuyuki Okuma (STARC), Po-Hung Chen (Univ. of Tokyo), Kazunori Watanabe (STARC), Takayasu Sakurai, Makoto Takamiya (Univ. of Tokyo) ICD2010-127
To effectively reduce output ripple of switched-capacitor DC-DC converters which generate variable output voltages, a no... [more] ICD2010-127
pp.163-167
ICD 2010-12-17
16:40
Tokyo RCAST, Univ. of Tokyo 0.18-V Input Charge Pump with Forward Body Biasing in Startup Circuit using 65nm CMOS
Po-Hung Chen, Koichi Ishida, Xin Zhang (Tokyo Univ.), Yasuyuki Okuma, Yoshikatsu Ryu (STARC), Makoto Takamiya, Takayasu Sakurai (Tokyo Univ.) ICD2010-128
In this paper, a 0.18-V input three-stage charge pump circuit applying forward body bias is proposed. In the developed c... [more] ICD2010-128
pp.169-173
 Results 21 - 34 of 34 [Previous]  /   
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