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Technical Committee on Integrated Circuits and Devices (ICD)  (Searched in: 2023)

In Hokkaido Prefecture

[Go to Official ICD Homepage (Japanese)] 
Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort: by Committee)
 Results 1 - 26 of 26  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD, ITE-IST [detail] 2023-08-01
10:00
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] Development of small-size high-resolution cyclic ADC with latest CMOS technology
Takashi Oshima, Keisuke Yamamoto, Goichi Ono (Hitachi) SDM2023-35 ICD2023-14
A tiny but high-resolution cyclic ADC is presented with 7nm CMOS process. The 1.5bit/stage cyclic ADC performs fully dif... [more] SDM2023-35 ICD2023-14
pp.1-5
SDM, ICD, ITE-IST [detail] 2023-08-01
10:45
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
A research on a cryogenic ADC for acquisition of environmental noise near quantum devices.
Tomoya Yamada, Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2023-36 ICD2023-15
Scaling up the number of qubits is essential to realize a fault-tolerant quantum computer. However, as the number of qub... [more] SDM2023-36 ICD2023-15
pp.6-9
SDM, ICD, ITE-IST [detail] 2023-08-01
11:10
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
Evaluation on Flip-Chip Packaging for Quantum Computers at Cryogenic Temperature
Misato Taguchi, Ryozo Takahashi (Kobe Univ.), Masako Kato, Nobuhiro Kusuno (Hitachi, Ltd), Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2023-37 ICD2023-16
Quantum Computers are the most promising technologies to archive more complex calculations. At the same time, much large... [more] SDM2023-37 ICD2023-16
pp.10-13
SDM, ICD, ITE-IST [detail] 2023-08-01
11:35
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
Linearity improvement of VCO based ADC with low power suplly voltage via complimentary bias voltage control
Takuto Togashi, Yoshihiro Komatsu, Masayuki Ikebe (Hokkaido Univ.)
 [more]
SDM, ICD, ITE-IST [detail] 2023-08-01
13:00
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] R and D of Low Power Semiconductor Technology and It's Application Expansions -- Review R and D of Semiconductor device and LSI for these 43 years --
Koichiro Ishibashi (UEC) SDM2023-38 ICD2023-17
LSI density has been doubling every two years for 64 years, since Moore’s law started in 1959. The presenter began resea... [more] SDM2023-38 ICD2023-17
pp.14-15
SDM, ICD, ITE-IST [detail] 2023-08-01
13:45
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] Research Trends in Low Power Sensors and Wireless Technology
Shiro Dosho, Noboru Ishihara, Hiroyuki Ito (TIT) SDM2023-39 ICD2023-18
It is no exaggeration to say that CMOS wireless circuits and CMOS sensor circuits are the most advanced technologies in ... [more] SDM2023-39 ICD2023-18
pp.16-21
SDM, ICD, ITE-IST [detail] 2023-08-01
14:30
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] Edge AI: Now and Future
Masato Motomura (Tokyo Tech)
 [more]
SDM, ICD, ITE-IST [detail] 2023-08-01
15:25
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] Low-Frequency Noise Source in the Cryogenic Operation of Short-Channel Bulk MOSFET
Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori (AIST) SDM2023-40 ICD2023-19
The assignment of low-frequency noise sources in the cryogenic operation of MOSFET is of great importance because of the... [more] SDM2023-40 ICD2023-19
pp.22-27
SDM, ICD, ITE-IST [detail] 2023-08-01
16:10
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
Additional High-Pressure Hydrogen Annealing Improves the Cryogenic Operation of Si (110)-oriented n-MOSFETs
Shunsuke Shitakata (Keio Univ./AIST), Hiroshi Oka, Takumi Inaba, Shota Iizuka, Kimihiko Kato, Takahiro Mori (AIST) SDM2023-41 ICD2023-20
Cryo-CMOS technology is highly demanded to realize control circuits of large-scale quantum computers, which control and ... [more] SDM2023-41 ICD2023-20
pp.28-31
SDM, ICD, ITE-IST [detail] 2023-08-01
16:35
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
Analysis of back bias effects and history phenomena in cryo 200nm SOIMOSFETs
Ryusei Ri, Takayuki Mori (KIT), Hiroshi Oka, Takahiro Mori (AIST), Jiro Ida (KIT) SDM2023-42 ICD2023-21
In this paper, we report the results of our ongoing analysis of a peculiar phenomenon in 200 nm SOI MOSFETs, which occur... [more] SDM2023-42 ICD2023-21
pp.32-35
SDM, ICD, ITE-IST [detail] 2023-08-02
09:00
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] A 33kDMIPS 6.4W Vehicle Communication Gateway Processor Achieving 10Gbps/W Network Routing, 40ms CAN Bus Start-Up and 1.4mW Standby
Kenichi Shimada, Keiichiro Sano, Kazuki Fukuoka, Hiroshi Morita, Masayuki Daito, Tatsuya Kamei, Hiroyuki Hamasaki, Yasuhisa Shimazaki (Renesas) SDM2023-43 ICD2023-22
 [more] SDM2023-43 ICD2023-22
pp.36-40
SDM, ICD, ITE-IST [detail] 2023-08-02
09:45
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
A 1W/8R 20T SRAM Codebook for Deep Learning Processors to Reduce Main Memory Bandwidth
Ryotaro Ohara, Masaya Kabuto, Masakazu Taichi, Atsushi Fukunaga, Yuto Yasuda, Riku Hamabe, Shintaro Izumi, Hiroshi Kawaguchi (Kobe Univ) SDM2023-44 ICD2023-23
We present a 1W8R 20T multi-port memory for codebook quantisation in deep learning processors, manufactured in a 40 nm p... [more] SDM2023-44 ICD2023-23
pp.41-44
SDM, ICD, ITE-IST [detail] 2023-08-02
10:10
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
A Small-Area and Highly-Linear Column Readout Circuit for LOFIC CMOS Image Sensor
Ryotaro Hotta, Shunsuke Okura, Ai Otani, Kazuki Tatsuta (Ritsmeikan), Ken Miyauchi, Han Sangman, Hideki Owada, Isao Takayanagi (Brillnics)
 [more]
SDM, ICD, ITE-IST [detail] 2023-08-02
10:45
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] The Image Sensor Technology: Building the Foundation for Information Sensing Societies
Hayato Wakabayashi (Sony Semiconductor Solutions)
 [more]
SDM, ICD, ITE-IST [detail] 2023-08-02
11:30
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] Multimodal flexible sensor system
Kuniharu Takei (Hokkaido Univ.)
 [more]
SDM, ICD, ITE-IST [detail] 2023-08-02
13:15
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] A Nanosheet Oxide Semiconductor FET Using ALD InGaOx Channel and InSnOx Electrode for 3D Integrated Devices
Masaharu Kobayashi, Kaito Hikake, Zhuo Li, Junxiang Hao, Chitra Pandy, Takuya Saraya, Toshiro Hiramoto (Univ. Tokyo), Takanori Takahashi, Mutsunori Uenuma, Yukiharu Uraoka (NAIST) SDM2023-45 ICD2023-24
(To be available after the conference date) [more] SDM2023-45 ICD2023-24
pp.45-49
SDM, ICD, ITE-IST [detail] 2023-08-02
14:00
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] Technology Trends in CMOS Devices for Advanced Logic LSIs -- FinFET, BS-PDN, GAA-NS-FET, CFET, 2D-CFET --
Hitoshi Wakabayashi (Tokyo Tech) SDM2023-46 ICD2023-25
Technology Trends in CMOS Devices are going to be discussed for Advanced Logic LSIs. [more] SDM2023-46 ICD2023-25
pp.50-55
SDM, ICD, ITE-IST [detail] 2023-08-02
14:45
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
Multi-Output MOSFET for Standard Sensor/Circuit Design Platform Device
Tomochika Harada (Yamagata University) SDM2023-47 ICD2023-26
This paper presents the multi-output MOSFET for a standard sensor/circuit design platform. Multi-output MOSFET has two s... [more] SDM2023-47 ICD2023-26
pp.56-59
SDM, ICD, ITE-IST [detail] 2023-08-03
09:30
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] Current issue & development prospects for 2D layered material devices
Kosuke Nagashio (UTokyo) SDM2023-48 ICD2023-27
(To be available after the conference date) [more] SDM2023-48 ICD2023-27
p.60
SDM, ICD, ITE-IST [detail] 2023-08-03
10:15
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] Demonstration of Recovery Annealing on 7-Bits per Cell 3D Flash Memory at Cryogenic Operation for Bit Cost Scalability and Sustainability
Yuta Aiba, Hitomi Tanaka, Fumie Kikushima, Hiroki Tanaka, Toshio Fujisawa, Hideko Mukaida, Tomoya Sanuki (KIOXIA) SDM2023-49 ICD2023-28
 [more] SDM2023-49 ICD2023-28
p.61
SDM, ICD, ITE-IST [detail] 2023-08-03
11:10
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
Stabilizing Variable Filters Using Inverse Trigonometric Functions
Tian-Bo Deng (Toho Univ.)
Digital-signal-processing (DSP) applications require a digital filter to change its frequency responses in a timely mann... [more]
SDM, ICD, ITE-IST [detail] 2023-08-03
11:35
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
A method for analyzing chlorophyll-a concentration in the seawater surface layer by image hue analysis.
Shunya Kosako, Toshihiko Hamasaki (HIT)
 [more]
SDM, ICD, ITE-IST [detail] 2023-08-03
13:00
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] Energy Field, Computer Shape
Noriyuki Miura (Osaka Univ.) SDM2023-50 ICD2023-29
 [more] SDM2023-50 ICD2023-29
pp.62-63
SDM, ICD, ITE-IST [detail] 2023-08-03
13:45
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] Load Adaptive Active Gate Driver Integrated Circuit for Power Device
Shusuke Kawai, Takeshi Ueno, Satoshi Takaya, Koutaro Miyazaki (Toshiba), Kohei Onizuka (Toshiba Europe Limited), Hiroaki Ishihara (Toshiba) SDM2023-51 ICD2023-30
 [more] SDM2023-51 ICD2023-30
pp.64-69
SDM, ICD, ITE-IST [detail] 2023-08-03
14:40
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
Real-Time Gate Current Change Gate Driver IC to Adapt to Operating Condition Variations of SiC MOSFETs
Dibo Zhang, Kohei Horii, Katsuhiro Hata, Makoto Takamiya (UTokyo) SDM2023-52 ICD2023-31
A digital gate driver IC with real-time gate current (IG) change by sensing drain current (ID) is applied to SiC MOSFETs... [more] SDM2023-52 ICD2023-31
pp.70-73
SDM, ICD, ITE-IST [detail] 2023-08-03
15:05
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
Gate Driver IC with Fully Integrated Overcurrent Protection Function by Measuring Gate-to-Emitter Voltage
Haifeng Zhang, Dibo Zhang, Hiromu Yamasaki, Katsuhiro Hata (Univ. of Tokyo), Keiji Wada (Tokyo Metropolitan Univ.), Kan Akatsu (Yokohama National Univ.), Ichiro Omura (Kyusyu Institute of Technology), Makoto Takamiya (Univ. of Tokyo) SDM2023-53 ICD2023-32
 [more] SDM2023-53 ICD2023-32
pp.74-78
 Results 1 - 26 of 26  /   
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