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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SSS | 2013-05-23 16:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Safety Issue under the High-aged Society Korefumi Tashiro (NTSEL), Hideo Nakamura (Nihon Univ.)  SSS2013-6 |
The functional safety standard IEC61508 becomes widely used in industry. The purpose of the functional safety is the saf... [more] | SSS2013-6 pp.21-24 |
| SSS | 2012-12-20 13:00 |
Kyoto | Safety of Food Processing Machine
-- On Safety of Newly Developed High-Pressure Food Processer in Niigata-JST Project -- Takabumi Fukuda (Nagaoka Univ. Tech.), Jumpei Fujii (NICO), Hirotaka Itoh (Nagaoka Univ. Tech.) SSS2012-22 |
High pressurizing process is available for some kinds of food to add new value on them. However, high pressure processin... [more] | SSS2012-22 pp.1-4 |
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| OME | 2012-05-24 14:00 |
Tokyo | NTT Musashino Research and Development Center | Electrospray Deposition (ESD) Technique with Colloidal Organic Semiconductor Dispersed in Water for Organic Photovoltaic Devices Tetsuya Aoyama, Hideaki Takaku, Jungmyoung Ju (RIKEN), Hiroshi Matsutaka (FLOX), Takaaki Orii, Yutaka Yamagata, Yusuke Tajima (RIKEN) OME2012-22 |
Organic thin film photovoltaic devices were fabricated using a novel aqueous processing. An active layer of poly(3-hexyl... [more] | OME2012-22 pp.17-20 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:55 |
Miyazaki | NewWelCity Miyazaki | A study on path selection results of an adaptive field test with process variation and aging degradation for VLSI Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyu Univ) VLD2011-85 DC2011-61 |
It has the problem that good VLSIs in production testing become defective VLSIs in the fields because small delays on si... [more] | VLD2011-85 DC2011-61 pp.191-195 |
| DC | 2011-06-24 14:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A study on path selection results of an adaptive field test with process variation and aging degradation for VLSI Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyuushu Univ) DC2011-10 |
It has the problem that good VLSIs in production testing become defective VLSIs in the fields because small delays on si... [more] | DC2011-10 pp.11-16 |
| DC | 2011-02-14 11:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An Analysis of Critical Paths for Field Testing with Process Variation Consideration Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushuu Univ) DC2010-61 |
Recently, it has the problem that good VLSIs in production testing become defective VLSIs in the fields because small de... [more] | DC2010-61 pp.13-19 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-12-01 11:25 |
Fukuoka | Kyushu University | Performance Evaluation for PUF-based Authentication Systems with Shift Post-processing Hyunho Kang, Yohei Hori, Toshihiro Katashita, Akashi Satoh (AIST) RECONF2010-49 |
A physical unclonable function (PUF) is a physical system with a device manufacturing variations and could be useful for... [more] | RECONF2010-49 pp.61-64 |
| MW | 2007-12-18 15:50 |
Fukui | Fukui Univ. | A Planar Waveguide Orthomode Transducer with Branch-Lines suitable for End-Milling Process Hiroya Andoh, Tomoko Yanagi, Shoji Atono, Takehiko Tsukamoto, Touko Sugiura (Toyota National Coll. of Tech.) MW2007-135 |
A planar ortho-mode transducer with branch-lines is designed and calculated. The ortho-mode transducer has an insertion ... [more] | MW2007-135 pp.47-51 |
| RECONF | 2005-09-16 10:00 |
Hiroshima | A Genetic Approach for Reconfigurable Mesh Connected Processors Yusuke Fukushima, Masaru Fukushi, Susumu Horiguchi (Tohoku Univ.) |
The recent advanced VLSI technology allows massively parallel systems to be fabricated on a single chip or silicon wafe... [more] |
RECONF2005-43 pp.13-18 |
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| KBSE | 2005-09-12 13:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg | RFID Information Systems for Production Process Visualization Shinobu Saito, Shigefumi Takahashi, Shuichiro Yamamoto (NTT DATA) |
This paper proposed a new point of implementation of RFID technology on production process in manufacturing industry, wh... [more] | KBSE2005-19 pp.19-24 |
| KBSE | 2005-05-16 14:40 |
Tokyo | Kikai-Shinko-kaikan Bldg. | Data model acquisition using local state transition diagrams of production process Satoshi Kumagai (Musashi Inst. of Tech.), Toyohiko Hirota (Kyushu Sangyo Univ.) |
Information system which supports manufacturing or production is strongly related with the materials to be processed. Ev... [more] | KBSE2005-3 pp.13-18 |
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