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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC, CPSY (Joint) |
2013-08-02 18:30 |
Fukuoka |
Kitakyushu-Kokusai-Kaigijyo |
A Method of Replacing Equivalent Instruction Sequence for Avioding Permanent Errors Masaya Kunimoto, Yuko Hara-Azumi, Yasuhiko Nakashima (NAIST) CPSY2013-30 |
(To be available after the conference date) [more] |
CPSY2013-30 pp.121-126 |
IPSJ-SLDM, VLD |
2012-05-30 16:20 |
Fukuoka |
Kitakyushu International Conference Center |
[Invited Talk]
How to Mitigate Reliability-related Issues on Nano-scaled LSIs Kazutoshi Kobayashi (KIT) VLD2012-5 |
According to aggressive process scaling, reliability issues on
semiconductor devices are becoming dominant such as vari... [more] |
VLD2012-5 pp.25-30 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:05 |
Miyazaki |
NewWelCity Miyazaki |
A DMR based Parmanent Error Locating Method for a Dependable FU Array Yohei Hazama, Jun Yao, Takashi Nakada, Yasuhiko Nakashima (NAIST) CPSY2011-51 |
Triple Modular Redundancy (TMR) is widely used to locating the erroneous unit inside electronic device when the possibil... [more] |
CPSY2011-51 pp.47-52 |
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