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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| NC, IBISML, IPSJ-BIO, IPSJ-MPS [detail] | 2018-06-13 10:25 |
Okinawa | Okinawa Institute of Science and Technology | Feature scaling in spectral classification of high dimensional data Momo Matsuda, Keiichi Morikuni, Akira Imakura, Tetsuya Sakurai (Univ. Tsukuba)  IBISML2018-2 |
We consider the classification problem for high dimensional data. Using prior knowledge on the labels of partial samples... [more] | IBISML2018-2 pp.9-14 |
| ET | 2018-05-19 11:20 |
Kanagawa | National Institute of Special Needs Education | Sharing the results of a Moodle course material clickstream analysis and examining its effect on students Konomu Dobashi (Aichi Univ.) ET2018-5 |
A face-to-face blended-type lesson was previously carried out using Moodle in PC classes attended by a large number of s... [more] | ET2018-5 pp.23-28 |
| PRMU, MVE, IPSJ-CVIM [detail] | 2018-01-18 09:30 |
Osaka | Trajectory semantic segmentation based on behavior models Daisuke Ogawa, Toru Tamaki, Bisser Raytchev, Kazufumi Kaneda (Hiroshima Univ.) PRMU2017-112 MVE2017-33 |
In many cases, such as trajectories clustering and classification, we often divide a trajectory into segments as preproc... [more] | PRMU2017-112 MVE2017-33 pp.1-7 |
|
| MoNA | 2017-12-21 14:40 |
Tokyo | Ochanomizu University | A Study of Decentralization for Data Mining System Implemented with Fully Homomorphic Encryption Yuri Yamamoto, Masato Oguchi (Ochanomizu Univ.) MoNA2017-37 |
For promoting utilization of big data, outsourcing systems have been proposed in which transaction data such as purchase... [more] | MoNA2017-37 pp.49-53 |
| IMQ | 2017-12-15 13:55 |
Shizuoka | Shizuoka University, Hamamatsu Campus | A Study of Diagnostic Imaging System for Coded Defect Detection of Certain Viewpoints on Multi-view 3D CG Images Norifumi Kawabata (Chiba Univ.) IMQ2017-21 |
At present, in the engineering fields, the medical application for multi-view 3D images and 8K UHDTV images is advanced ... [more] | IMQ2017-21 pp.7-12 |
| CAS, MSS, IPSJ-AL [detail] | 2017-11-17 11:15 |
Tokyo | [Invited Talk]
Open Data of Air Traffic and its Application Megumi Oka, Yutaka Fukuda (ENRI) CAS2017-53 MSS2017-37 |
The Ministry of Land, Infrastructure and Transport of Japan has formulated a long-term vision for future air traffic sys... [more] | CAS2017-53 MSS2017-37 pp.95-100 |
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| KBSE | 2017-11-10 15:45 |
Shizuoka | Estimation of business rules using Associations analysis Takuya Saruwatari, Akio Jin, Masayuki Inoue, Teruko Miyata, Daisuke Hamuro (NTT), Noriaki Izumi (AIST) KBSE2017-27 |
Recently, IT system renewal projects are increased along with aging of IT systems. In such a project, it is necessary to... [more] | KBSE2017-27 pp.7-12 |
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| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-06 14:55 |
Kumamoto | Kumamoto-Kenminkouryukan Parea | An Approach to Selection of Classifiers and their Thresholds for Machine Learning Based Fail Chip Prediction Daichi Yuruki, Satoshi Ohtake (Oita Univ), Yoshiyuki Nakamura (Renesas Electronics) VLD2017-36 DC2017-42 |
Today, semiconductor technologies have developed and advance the integration density of LSI circuits. A technique which... [more] |
VLD2017-36 DC2017-42 pp.55-60 |
| SDM | 2017-10-26 09:30 |
Miyagi | Niche, Tohoku Univ. | [Invited Talk]
Utilization of Big Data for Innovation in Semiconductor Memory Manufacturing
-- Comprehensive Big-Data-Based Monitoring System for Yield Analysis in Semiconductor Manufacturing -- Hiroshi Akahori (Toshiba Memory), Kouta Nakata, Ryohei Orihara, Yoshiaki Mizuoka, Kentaro Takagi (Toshiba), Kenichi Kadota, Takaharu Nishimura, Yukako Tanaka, Hidetaka Eguchi (Toshiba Memory) SDM2017-55 |
In this work, we focus on yield analysis task where engineers identify the cause of failure from wafer failure map patte... [more] | SDM2017-55 pp.31-33 |
| ISEC, WBS, IT | 2017-03-10 16:00 |
Tokyo | TOKAI University | Development of Security Incident Symptomatic Analysis function in SIAS Mitsumu Katsuno, Hiroki Sakamoto, Hiroyuki Ookawa, Takashi Yamaguchi, Eiji Nunohiro (TUIS), Akira Orita, Tatsuya Sekiguchi (HISYS.ISR) IT2016-134 ISEC2016-124 WBS2016-110 |
(To be available after the conference date) [more] | IT2016-134 ISEC2016-124 WBS2016-110 pp.223-228 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2017-03-10 09:30 |
Okinawa | Kumejima Island | Pass/Fail Prediction in LSI Test Considering Fail Die Characteristics. Takazumi Sato, Michiko Inoue (NAIST) CPSY2016-144 DC2016-90 |
Various kinds of tests are applied to LSIs in several satages to ship only fully reliable products.However, a lot of kin... [more] | CPSY2016-144 DC2016-90 pp.291-296 |
| DC | 2017-02-21 12:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An Approach to Performance Improvement of Machine Learning Based Fail Chip Discrimination Daichi Yuruki, Satoshi Ohtake (Oita Univ), Yoshiyuki Nakamura (Renesas System Design) DC2016-77 |
Today, advancements of semiconductor technology have progress to high integration of LSI circuits. A technique which ke... [more] |
DC2016-77 pp.17-22 |
| NLC, IPSJ-IFAT | 2017-02-10 13:55 |
Osaka | Detecting Earthquake Survivors with Serious Mental Damage Tatsuya Aoki (Tokyo Tech), Tetsuya Nasukawa, Katsumasa Yoshikawa (IBM Research), Hiroya Takamura, Manabu Okumura (Tokyo Tech) NLC2016-48 |
The 2011 Great East Japan Earthquake and 2016 Kumamoto Earthquakes had a great impact to numerous people all over the wo... [more] | NLC2016-48 pp.65-70 |
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| ET | 2017-01-28 16:30 |
Kanagawa | National Institute of Special Needs Education | Development of a Method for Analyzing Source Code Editing Processes to Estimate Students' Learning Situations Kei Ishiwada, Yasuhiko Morimoto (TGU), Shoichi Nakamura, Hiroki Nakayama (FU), Youzou Miyadera (TGU) ET2016-92 |
In the programming exercise lesson, it is expected that estimating learning situation based on the source code editing p... [more] | ET2016-92 pp.75-80 |
| IA | 2017-01-27 15:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. B3 Kenshu-2 room | Development and evaluation of population monitoring system that assumes outdoor events Keita Arai (Nagaoka Univ. of Tech.), Hiroshi Yamamoto (Ritsumeikan Univ.), Yamazaki Katsuyuki (Nagaoka Univ. of Tech.) IA2016-87 |
It is important to manage the number of visitors in order to improve the event quality and to keep visitors' safety in a... [more] | IA2016-87 pp.49-54 |
| ICD, CPSY | 2016-12-15 10:55 |
Tokyo | Tokyo Institute of Technology | Proposal of anonymization methods for secondary use considering data properties Yuichi Nakamura, Takahiro Hosoe, Hiroaki Nishi (Keio Univ.) ICD2016-53 CPSY2016-59 |
Applications for secondary use of data, which is a usage that is not same as an original purpose to obtain the data, hav... [more] | ICD2016-53 CPSY2016-59 pp.13-18 |
| ET | 2016-07-09 11:50 |
Miyagi | Tohoku Gakuin University | Development of a Tool for Analyzing the Edit Histories of Programs to Estimate the Learning Situations Kei Ishiwada, Yasuhiko Morimoto (Tokyo Gakugei Univ.), Shoichi Nakamura (Fukushima Univ.), Youzou Miyadera (Tokyo Gakugei Univ.) ET2016-25 |
In this study, we aim to estimate students’ learning situations in the Programming Exercise class, based on their progra... [more] | ET2016-25 pp.21-26 |
| ET | 2016-06-11 13:00 |
Aichi | Nagoya Institute of Technology | Time Series Cross Section tables to monitor the course materials page views
-- Development of Excel macro for Time Series Cross Section analysis -- Konomu Dobashi (Aichi Univ.) ET2016-12 |
To enable teachers to monitor student engagement and improve classroom instruction, a data mining method and an Excel ma... [more] | ET2016-12 pp.25-30 |
| RECONF | 2016-05-19 14:55 |
Kanagawa | FUJITSU LAB. | * Kasha Yamamoto, Tetsuya Asai, Masato Motomura (Hokkaido Univ.) RECONF2016-10 |
In recent years, the amount of data to be processed in the data center has increased exprosively. Therefore the data min... [more] | RECONF2016-10 pp.47-52 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2016-03-25 15:45 |
Nagasaki | Fukue Bunka Hall/Rodou Fukushi Center | A consideration on variation correction for fail prediction in LSI test Ryo Ogawa (NAIST), Yoshiyuki Nakamura (Renesas Semiconductor Package & Test Solutions), Michiko Inoue (NAIST) CPSY2015-158 DC2015-112 |
Recently, a test cost reduction using data mining has been attracted. It is expected to reduce the cost by predicting fa... [more] | CPSY2015-158 DC2015-112 pp.271-276 |
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