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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| RECONF, CPSY, VLD, IPSJ-SLDM [detail] | 2015-01-29 17:40 |
Kanagawa | Hiyoshi Campus, Keio University | Analyzing the Impacts of Simultaneous Supply and Threshold Voltage Tuning on Energy Dissipation in VLSI Circuits Toshihiro Takeshita, Shinichi Nishizawa, AKM Mahfuzul Islam, Tohru Ishihara, Hidetoshi Onodera (Kyoto Univ)  VLD2014-129 CPSY2014-138 RECONF2014-62 |
Simultaneous supply and threshold voltage tuning has a strong impact on the energy reduction of LSI circuits. Therefore,... [more] | VLD2014-129 CPSY2014-138 RECONF2014-62 pp.111-116 |
| SDM | 2015-01-27 15:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Accurate Prediction of PBTI Lifetime in N-type Fin-Channel High-k Tunnel FETs Wataru Mizubayashi, Takahiro Mori, Koichi Fukuda, Yongxun Liu, Takashi Matsukawa, Yuki Ishikawa, Kazuhiko Endo, Shinichi Ohuchi, Junichi Tsukada, Hiromi Yamauchi, Yukinori Morita, Shinji Migita, Hiroyuki Ota, Meishoku Masahara (AIST) SDM2014-143 |
The positive bias temperature instability (PBTI) characteristics for n-type fin-channel tunnel FETs (TFETs) with high-k ... [more] | SDM2014-143 pp.33-36 |
| IT | 2014-09-19 10:15 |
Chiba | A (k,n)-Threshold Scheme with Detectability of All the Cheaters Based on a Certain Majority Rule Noriaki Shimazaki, Hiroki Koga (Univ. of Tsukuba) IT2014-44 |
In Shamir's $(k,n)$-threshold scheme, if cheaters are involved in $k$ participants and give illegal shares in the recons... [more] | IT2014-44 pp.19-24 |
|
| ICD, SDM | 2014-08-05 14:55 |
Hokkaido | Hokkaido Univ., Multimedia Education Bldg. | Initial Frequency Degradation on Ring Oscillators in 65-nm SOTB Process Caused by Plasma-Induced Damage Azusa Oshima, Ryo Kishida, Michitarou Yabuuchi, Kazutoshi Kobayashi (KIT) SDM2014-79 ICD2014-48 |
Reliability issues, such as plasma-induced damage (PID) and Bias Temperature Instability (BTI), become dominant on inte... [more] |
SDM2014-79 ICD2014-48 pp.93-98 |
| EMM | 2014-05-15 14:30 |
Tokyo | Secret Sharing based on Image Representation using Compressed Sensing Michiharu Niimi, Shinya Isaki, Hideki Noda (KIT) EMM2014-2 |
Due to the development of information technology, many types of data including documents, image and audio, etc. is digit... [more] | EMM2014-2 pp.5-10 |
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| NLP | 2014-03-10 11:15 |
Tokyo | Sophia University | A Study of Hysteresis Relaxation Oscillator Driven by a Periodic Square Wave Takuya Kurihara, Kenya Jin'no (Nippon Inst. of Tech.) NLP2013-167 |
In order to clarify synchronization phenomena, we analyze a relaxation oscillator which contains a hysteresis element. ... [more] |
NLP2013-167 pp.15-20 |
| SDM | 2014-01-29 13:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Analysis of Transistor Characteristics in Distribution Tails beyond ±5.4σ of 11 Billion Transistors Tomoko Mizutani, Anil Kumar, Toshiro Hiramoto (Univ. of Tokyo) SDM2013-142 |
Transistors in distribution tails of 11G (11 billion) transistors were intensively measured and compared with transistor... [more] | SDM2013-142 pp.31-34 |
| SDM | 2013-12-13 17:00 |
Nara | NAIST | A Study of Threshold Voltage Instability in 4H-SiC MOSFETs with POCl3- and NO-Annealed Gate Oxides Natsuko Kanafuji, Hiroshi Yano, Ai Osawa, Tomoaki Hatayama, Takashi Fuyuki (NAIST) SDM2013-132 |
4H-SiC MOSFETs are expected as low loss power devices with high blocking voltage. Threshold voltage instability is one o... [more] | SDM2013-132 pp.97-100 |
| EMM, ISEC, SITE, ICSS, IPSJ-CSEC, IPSJ-SPT [detail] | 2013-07-19 09:10 |
Hokkaido | A Note on a Construction of Gateway Threshold Password-based Authenticated Key Exchange Yukou Kobayashi, Naoto Yanai, Takashi Nishide, Eiji Okamoto (Univ. of Tsukuba) ISEC2013-35 SITE2013-30 ICSS2013-40 EMM2013-37 |
Password-based authenticated key exchange (PAKE) allowing users to utilize passwords as secret information is suitable f... [more] | ISEC2013-35 SITE2013-30 ICSS2013-40 EMM2013-37 pp.247-254 |
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| VLD, IPSJ-SLDM | 2013-05-16 09:00 |
Fukuoka | Kitakyushu International Conference Center | Performance-driven SRAM Macro Design with Parameterized Cell Considering Layout-dependent Effects Yu Zhang, Shigetoshi Nakatake (Univ. of Kitakyushu) VLD2013-1 |
In nano-scale process, shallow trench isolation (STI) stress and well proximity effect (WPE) affect the threshold volta... [more] |
VLD2013-1 pp.1-6 |
| IT, ISEC, WBS | 2013-03-08 11:20 |
Osaka | Kwansei Gakuin Univ., Osaka-Umeda Campus | Evaluations of Cheating-Detection Capability in the (k,n)-Threshold Scheme Based on the Majority Rule Noriaki Shimazaki, Hiroki Koga (Univ. of Tsukuba) IT2012-91 ISEC2012-109 WBS2012-77 |
The $(k,n)$-threshold scheme is a kind of secret sharing scheme. In this scheme，a secret is encoded to $n$ shares and ... [more] |
IT2012-91 ISEC2012-109 WBS2012-77 pp.181-188 |
| IT, ISEC, WBS | 2013-03-08 15:10 |
Osaka | Kwansei Gakuin Univ., Osaka-Umeda Campus | Threshold Algorithms for Decoding Spinal Codes Yu Morishima, Ikuo Oka, Shingo Ata (Osaka City Univ.) IT2012-109 ISEC2012-127 WBS2012-95 |
Spinal codes are a recently proposed rateless code that achieves Shannon capacity on additive white Gaussian noise chann... [more] | IT2012-109 ISEC2012-127 WBS2012-95 pp.297-302 |
| EMM | 2013-01-30 11:10 |
Miyagi | Tohoku Univ. | A Secret Sharing Method for String Data Incorporating Their Transformation Kana Tsukui, Hidetoshi Yokoo (Gunma Univ.) EMM2012-100 |
Most real data are essentially string data, i.e., sequences of symbols. This paper proposes a practical secret sharing... [more] |
EMM2012-100 pp.53-58 |
| ICD, SDM | 2012-08-02 10:00 |
Hokkaido | Sapporo Center for Gender Equality, Sapporo, Hokkaido | Self-Improvement of Cell Stability in SRAM by Post Fabrication Technique Anil Kumar, Takuya Saraya (Univ. of Tokyo), Shinji Miyano (STARC), Toshiro Hiramoto (Univ. of Tokyo) SDM2012-65 ICD2012-33 |
The post fabrication technique for self-improvement of SRAM cell stability is validated by experiment using 1k DMA SRAM ... [more] | SDM2012-65 ICD2012-33 pp.13-16 |
| RCS, NS, USN (Joint) |
2012-07-19 13:20 |
Iwate | Iwate Univ. | Experimental Evaluations on User Pair Selection for 4-by-2 MU-MIMO Using AMC with Outer-Loop Threshold Control in LTE-Advanced Downlink Keisuke Saito, Yuichi Kakishima, Teruo Kawamura, Yoshihisa Kishiyama (NTT DOCOMO), Hidekazu Taoka (DOCOMO Euro Labs.), Hidehiro Andoh (NTT DOCOMO) RCS2012-79 |
This paper presents laboratory experimental results on user pair selection for 4-by-2 multi-user (MU)-MIMO employing min... [more] | RCS2012-79 pp.25-30 |
| ICD | 2012-04-24 14:50 |
Iwate | Seion-so, Tsunagi Hot Spring (Iwate) | Device-Conscious Circuit Designs for 0.5-V High-Speed Nanoscale CMOS LSIs Akira Kotabe, Kiyoo Itoh, Riichiro Takemura, Ryuta Tsuchiya (Hitachi), Masashi Horiguchi (Renesas) ICD2012-15 |
The feasibility of 0.5-V memory-rich nanoscale CMOS LSIs was studied. First, nanoscale fully-depleted MOSFETs (FD MOS) a... [more] | ICD2012-15 pp.79-84 |
| NLP | 2012-04-20 11:10 |
Mie | Ise City Plaza | Fundamental Characteristic of Hysteresis Domain Partitioning Optimization Method Kenya Jin'no (NIT), Masafumi Kubota, Toshimichi Saito (Hosei Univ.) NLP2012-15 |
In this article, we propose a novel optimization problem solver. The novel optimization problem The search area is dis... [more] |
NLP2012-15 pp.79-82 |
| MBE | 2012-01-27 12:00 |
Fukuoka | Kyushu University | On the Automatic Thresholding for Arrhythmia Detection Using Antidictionary Coding Takahiro Ota, Kiyokatsu Maruyama, Shinya Otagiri (NPIT), Hiroyoshi Morita (UEC) MBE2011-82 |
An arrhythmia detection system using antidictionary coding has been proposed, and the system has the advantage of real-t... [more] | MBE2011-82 pp.21-26 |
| NLP | 2011-11-09 14:30 |
Okinawa | Miyako Island Marine Terminal | Dynamics analysis of charge pump with threshold control Takato Endo, Toshimichi Saito (HU) NLP2011-101 |
This paper studies basic dynamics of charge pump circuits with a threshold control. Adjusting the threshold value, the... [more] |
NLP2011-101 pp.55-59 |
| SDM | 2011-10-21 14:00 |
Miyagi | Tohoku Univ. (Niche) | [Invited Talk]
Design Framework for Parameter Fluctuation in MOSFET Damaged by Ion Bombardment during Plasma Etching Koji Eriguchi, Yoshinori Nakakubo, Asahiko Matsuda, Yoshinori Takao, Kouichi Ono (Kyoto Univ.) SDM2011-110 |
We investigated the effects of plasma process-induced physical damage (bombardment of ions) on MOSFET performance degrad... [more] | SDM2011-110 pp.73-78 |
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