Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ |
2018-01-19 14:30 |
Okayama |
|
Insertion of LC Resonator onto Cryptographic Module for Accelerated Evaluation of Side Channel Attack Naoki Kawata, Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2017-101 |
Resistance evaluation for differential power analysis (DPA) and differential electromagnetic analysis (DEMA) kinds of si... [more] |
EMCJ2017-101 pp.77-81 |
HWS (2nd) |
2017-06-13 09:25 |
Aomori |
Hirosaki University |
A Study of Chosen Plaintexts Having Equivalent Probability Distribution to Population in Hamming Distance for Cost Reduction of Security Evaluation against Side-Channel Attacks Toshiaki Teshima, Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) |
(Advance abstract in Japanese is available) [more] |
|
EMCJ, IEE-EMC, IEE-MAG |
2017-05-18 14:46 |
Overseas |
Nanyang Technological University |
[Poster Presentation]
Electromagnetic Information Leakage Analysis of Cryptographic IC in Correlation Power Analysis Yasunari Kumano, Yusuke Yano, Kengo Iokibe, Hiroto Kagotani, Yoshitaka Toyota (Okayama Univ.) EMCJ2017-10 |
We observed and analyzed electromagnetic information leakage of the Advanced Encryption Standard (AES) cryptographic cir... [more] |
EMCJ2017-10 pp.7-8 |
EMCJ |
2017-04-14 16:25 |
Tokyo |
NTT Musashino R&D Center |
Parameter Identification of A Noise-source Linear Equivalent Circuit of DC-DC Converter Yuhei Osaki, Yusuke Yano, Kengo Iokibe, Yositaka Toyota (Okayama Univ.) EMCJ2017-6 |
[more] |
EMCJ2017-6 pp.29-34 |
EMCJ, IEE-EMC, MW, EST [detail] |
2016-10-21 09:00 |
Miyagi |
Tohoku Univ. |
Attempt for Determining Cryptographic Circuit Blocks Leaking Side-Channel Information Based on Internal Current Source
-- Examination with FPGA Implementation of AES Circuits -- Kengo Iokibe, Naoki Kawata, Yusuke Yano, Hiroto Kagotani, Yoshitaka Toyota (Okayama Univ.) EMCJ2016-74 MW2016-106 EST2016-70 |
For efficient security enhancement of cryptographic ICs against side-channel attacks (SCAs), it is important to identify... [more] |
EMCJ2016-74 MW2016-106 EST2016-70 pp.79-84 |
EMCJ, IEE-EMC, IEE-MAG |
2016-06-02 13:36 |
Overseas |
NTU, Taiwan |
[Poster Presentation]
Investigation of Relationship between Signal-to-Noise Ratio of EM Information Leakage and Side-Channel Attacking Cost. Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2016-25 |
Attacking cost of side-channel attack (SCA) can increase by application of various countermeasures to electromagnetic (E... [more] |
EMCJ2016-25 pp.23-24 |
EMCJ, IEE-EMC, IEE-MAG |
2016-06-02 13:42 |
Overseas |
NTU, Taiwan |
[Poster Presentation]
Validation of Optimization Method of On-board RL Snubber According to Q Factor Naoki Kawata, Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2016-27 |
We proposed RL snubber to damp resonance in power distribution network (PDN) for digital integrated circuits (ICs). RL s... [more] |
EMCJ2016-27 pp.29-30 |
EMCJ |
2016-05-13 15:15 |
Hokkaido |
Hokkaido University |
Linear Equivalent Circuit Modeling of Power Converter Circuit for Condunted Disturbance Estimation
-- Impact of Trigger Timing on the modeling -- Yusuke Yano, Hiroki Geshi, Kengo Iokibe (Okayama Univ.), Tetsushi Watanabe (Industrial Technology Center of Okayama Prefecture), Yoshitaka Toyota (Okayama Univ.) EMCJ2016-16 |
We proposed a linear equivalent circuit model of power converter circuit for efficient reduction design of conducted EMI... [more] |
EMCJ2016-16 pp.41-45 |
EMCJ |
2012-04-20 15:35 |
Ishikawa |
Kanazawa Univ. |
RL Damper Circuit for Electoromagnetic Compatibility and Power Integrity of Integrated Circuits Ryosuke Yamagata, Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2012-8 |
Resonances of the parasitic impedance in power distribution network (PDN) increase power current in radio frequency that... [more] |
EMCJ2012-8 pp.43-48 |
EMCJ, IEE-EMC |
2011-10-28 13:50 |
Aomori |
Hachinohe Grand Hotel |
Insertion of Dumping Resistor to Reduce RF IC-Power-Current Peak Caused by Resonance due to Parasitic Impedance Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2011-84 |
High-frequency current caused by simultaneous switching of digital gates which leaks toward the DC power supply into the... [more] |
EMCJ2011-84 pp.29-34 |
EMCJ |
2010-07-15 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Effective Position of Decoupling Inductor Taking Parasitic Capacitances on Power Distribution Network Traces into Account Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.) EMCJ2010-28 |
High-frequency current caused by simultaneous switching of digital gates can be increased with decoupling capacitors,bec... [more] |
EMCJ2010-28 pp.39-44 |