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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
EE, CPM 2015-02-27
13:50
Tokyo NTT Musashino R&D Center Energy Management System Simulation with NetLogo
Tomonobu Itagaki, Noboru Ishihara, Takashi Suganuma, Toyonari Shimakage (TIT), Taku Ishibashi, Norikazu Takeuchi (NTT Facilities), Nobuhiko Yamashita (NTT), Kenji Yokoyama, Kazuya Masu (TIT) EE2014-47 CPM2014-161
In the study of large-scale energy management system, NetLogo, an agent-based modeling environment for simulating social... [more] EE2014-47 CPM2014-161
pp.37-42
EE, CPM 2015-02-27
14:15
Tokyo NTT Musashino R&D Center Modeling and Simulation of Home Nanogrid Energy Management System using the internal price of electricity
Takashi Suganuma, Noboru Ishihara, Tomonobu Itagaki, Toyonari Shimakage (TIT), Taku Ishibashi, Norikazu Takeuchi (NTT Facilities), Nobuhiko Yamashita (NTT), Kenji Yokoyama, Kazuya Masu (TIT) EE2014-48 CPM2014-162
Abstract The prevalence and diffusion of the distributed generator and battery accelerate the autonomous-decentralizing ... [more] EE2014-48 CPM2014-162
pp.43-48
MW
(2nd)
2014-11-26
- 2014-11-28
Overseas King Mongkut's Institute of Technology Ladkrabang (KMITL), Bangkok A 0.5-V 5.8-GHz Current-Reuse-VCO-Based PLL with Amplitude Regulation Technique
Sho Ikeda, Sang_yeop Lee, Hiroyuki Ito, Noboru Ishihara, Kazuya Masu (Tokyo Tech.)
This paper presents design and detail measurement results of the ultra-low-power 5.8-GHz PLL with a current-reuse VCO an... [more]
MW 2013-03-08
13:30
Hiroshima Hiroshima Univ. [Invited Talk] A Study of Ultra-Low-Power RF CMOS Transceiver Circuit Technologies
Hiroyuki Ito, Sang-Yeop Lee, Sho Ikeda, Jiang Hao, Noboru Ishihara, Kazuya Masu (Tokyo Inst. of Tech.) MW2012-187
 [more] MW2012-187
pp.153-156
ICD 2011-12-15
10:30
Osaka   An Inductorless Phase-Locked Loop with Pulse Injection Locking Technique in 90 nm CMOS
Sang-Yeop Lee, Hiroyuki Ito, Noboru Ishihara, Kazuya Masu (Tokyo Inst. of Tech.) ICD2011-100
An inductorless phase-locked loop with subharmonic pulse injection locking was realized (PLL area: 0.08 $\mathrm{mm}^2$)... [more] ICD2011-100
pp.1-6
EMCJ, ITE-BCT 2010-03-12
15:20
Tokyo Kikai-Shinko-Kaikan Bldg. Design and Fabrication of On-chip Integrated Magnetic Field Probe using Low Noise Amplifier
Shiori Namba, Wataru Kodate, Masahiro Yamaguchi (Tohoku Univ.), Shoji Kawahito (Shizuoka Univ.), Noboru Ishihara (Tokyo Inst. of Tech.) EMCJ2009-132
An on-chip integrated magnetic field probe has been designed and fabricated using CMOS technology. This probe will be us... [more] EMCJ2009-132
pp.37-42
SR 2009-07-30
16:20
Tokyo Tokyo institute of technology [Invited Talk] RF CMOS Integrated Circuit -- Reconfigurability and Scalability --
Kazuya Masu, Noboru Ishihara, Shuhei Amakawa (Tokyo Tech) SR2009-48
We discuss the issues of present and future RF CMOS integrated circuit, which is the most significant hardware component... [more] SR2009-48
pp.165-166
ED, MW 2008-01-17
09:45
Tokyo Kikai-Shinko-Kaikan Bldg. Examination of dual band CMOS RF power amplifier circuit
Jun Kikuchi (Gunma Univ.), Hisayasu Sato (Renesas Technology Corporation), Noboru Ishihara (Gunma Univ.) ED2007-214 MW2007-145
Dual-band CMOS RF power amplifier circuit design techniques have been studied. In CMOS power amplifier design with low p... [more] ED2007-214 MW2007-145
pp.45-50
ED, MW 2008-01-17
10:10
Tokyo Kikai-Shinko-Kaikan Bldg. Wide-Band BPSK CMOS Demodulator Circuit
Yasuyuki Arai, Jun Kikuchi, Ryuichi Ujiie, Kenichi Shibata (Gunma Univ.), Tetuya Hirama, Hisayasu Sato (Renesas Technology), Noboru Ishihara (Gunma Univ.) ED2007-215 MW2007-146
In recent LSI systems, the wiring connections between the LSI and the LSI or the board and the board have become high de... [more] ED2007-215 MW2007-146
pp.51-56
MW, ED 2007-01-17
10:10
Tokyo Kikai-Shinko-Kaikan Bldg. Vdd Gate Biasing RF CMOS Amplifier Design Technique Based on the Effect of Carrier Velocity Saturation
Noboru Ishihara (Gunma Univ.)
One of the interesting MOSFET characteristics is the effect of carrier velocity saturation (CVS) on the drain current. I... [more] ED2006-201 MW2006-154
pp.7-12
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