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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 54  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
COMP 2024-03-14
16:00
Tokyo The University of Electro-Communications Time Analysis of Space Efficient Uniform Partitioning in Population Protocols
Pascal Sahner (NAIST/RWTH Aachen), Ryota Eguchi (NAIST), Fukuhito Ooshita (FUT), Michiko Inoue (NAIST) COMP2023-34
Population protocols are a theoretical model for modeling a set of units with low computational capabilities - so called... [more] COMP2023-34
pp.34-41
PRMU, MVE, VRSJ-SIG-MR, IPSJ-CVIM 2024-01-25
09:27
Kanagawa Keio Univ. (Hiyoshi Campus) PRMU2023-39 (To be available after the conference date) [more] PRMU2023-39
pp.1-6
HWS, VLD 2023-03-01
11:50
Okinawa
(Primary: On-site, Secondary: Online)
Acceleration of Memristor Modeling Based on Machine Learning Using Gaussian Process
Yuta Shintani, Michiko Inoue (Naist), Michihiro Shintani (Kyoto Institute of Technology) VLD2022-75 HWS2022-46
There has been a great deal of research into the development of domain-specific circuits for multiply-and-accumulate pro... [more] VLD2022-75 HWS2022-46
pp.13-18
HWS, VLD 2023-03-01
13:25
Okinawa
(Primary: On-site, Secondary: Online)
Programmable Binary Hyperdimensional Computing Accelerator for Low Power Devices
Yuya Isaka (NAIST), Nau Sakaguchi (SJSU), Michiko Inoue (NAIST), Michihiro Shintani (KIT) VLD2022-76 HWS2022-47
Hyperdimensional computing (HDC) can perform various cognitive tasks efficiently by mapping data to hyperdimensional vec... [more] VLD2022-76 HWS2022-47
pp.19-24
HWS, VLD 2023-03-02
13:25
Okinawa
(Primary: On-site, Secondary: Online)
[Memorial Lecture] Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects
Takuma Nagao (NAIST), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (Sony Semiconductor Manufacturing), Michiko Inoue (NAIST), Michihiro Shintani (Kyoto Institute of Technology) VLD2022-91 HWS2022-62
Statistical wafer-level variation modeling is an attractive method for reducing the measurement cost in large-scale inte... [more] VLD2022-91 HWS2022-62
p.109
VLD, HWS [detail] 2022-03-08
09:55
Online Online Wafer-Level Characteristic Variation Modeling with Considering Discontinuous Effect Caused by Manufacturing Equipment
Takuma Nagao (National Institute of Technology (KOSEN)), Michihiro Shintani (Nara Institute of Science and Technology), Ken'ichi Yamaguchi, Hiroshi Iwata (National Institute of Technology (KOSEN)), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (SCK), Michiko Inoue (Nara Institute of Science and Technology) VLD2021-92 HWS2021-69
Statistical methods for predicting the performance of large-scale integrated circuits (LSIs) manufactured on a wafer are... [more] VLD2021-92 HWS2021-69
pp.87-92
COMP 2021-10-23
14:30
Online Online Algorithms for Graph Class Identification Problems in the Population Protocol Model
Hiroto Yasumi, Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2021-17
In this paper, we focus on graph class identification problems in the population protocol model.
A graph class identifi... [more]
COMP2021-17
pp.20-27
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2021-03-26
10:40
Online Online Unsupervised Recycled FPGA Detection Using Direct Density Ratio Estimation Based on Self-referencing
Yuya Isaka (KGU), Michihiro Shintani (NAIST), Foisal Ahmed (PU), Michiko Inoue (NAIST) CPSY2020-60 DC2020-90
It is well known that the performance of field-programmable gate-array (FPGA) degrades over time due to their usage. Sev... [more] CPSY2020-60 DC2020-90
pp.61-66
DC 2021-02-05
10:55
Online Online Hardware Trojan Detection by Learning Power Side Channel Signals Considering Random Process Variation
Michiko Inoue, Riaz-Ul-Haque Mian (NAIST) DC2020-70
Due to the globalization and complexity of the supply chain, there is a growing concern about the insertion of hardware ... [more] DC2020-70
pp.7-11
COMP, IPSJ-AL 2020-09-02
10:30
Online Online Uniform Bipartition in Population Protocol Model over Arbitrary Communication Networks
Hiroto Yasumi, Fukuhito Ooshita, Michiko Inoue (NAIST), Sebastien Tixeuil (Sorbonne Universite) COMP2020-8
In this paper, we focus on the uniform bipartition problem in the population protocol model. This problem aims to divide... [more] COMP2020-8
pp.17-24
COMP, IPSJ-AL 2020-05-09
16:15
Online Online Gathering for mobile agents with a strong team in weakly Byzantine environments
Jion Hirose, Masashi Tsuchida (NAIST), Junya Nakamura (TUT), Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2020-2
We study the gathering problem requiring a team of mobile agents to gather at a single node in arbitrary networks. The t... [more] COMP2020-2
pp.9-16
HWS, VLD [detail] 2020-03-05
10:55
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Fault-tolerant Design for Memristor Neural Network Using Checksum and Online Testing
Mamoru Ishizaka, Michihiro Shintani, Michiko Inoue (NAIST) VLD2019-112 HWS2019-85
 [more] VLD2019-112 HWS2019-85
pp.107-112
DC 2020-02-26
16:10
Tokyo   Accurate Recycled FPGA Detection Based on Exhaustive Path Analysis
Michihiro Shintani, Foisal Ahmed, Michiko Inoue (NAIST) DC2019-96
 [more] DC2019-96
pp.61-66
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-13
10:55
Ehime Ehime Prefecture Gender Equality Center VLD2019-31 DC2019-55 In testing of large scale integration (LSI) circuit, test escape detection using machine learning algorithms has been at... [more] VLD2019-31 DC2019-55
pp.13-18
COMP, IPSJ-AL 2019-05-11
15:10
Kumamoto Kumamoto University Ring Exploration Algorithms for Myopic Luminous Robots with Larger Visibility
Shota Nagahama, Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2019-7
In this paper, we investigate ring exploration algorithms for autonomous mobile robots. The robots are myopic, that is, ... [more] COMP2019-7
pp.83-90
DC 2019-02-27
09:25
Tokyo Kikai-Shinko-Kaikan Bldg. Variational Autoencoder-Based Efficient Test Escape Detection
Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) DC2018-72
 [more] DC2018-72
pp.7-12
DC 2019-02-27
10:55
Tokyo Kikai-Shinko-Kaikan Bldg. Efficient Challenge-Response Pairs Generation and Evaluation for PUF Circuit Using BIST Circuit During Manufacturing Test
Tomoki Mino, Shintani Michihiro, Michiko Inoue (NAIST) DC2018-75
Recently, counterfeited ICs have become a big problem for semiconductor supply chains. One of the countermeasures for th... [more] DC2018-75
pp.25-30
DC 2019-02-27
11:45
Tokyo Kikai-Shinko-Kaikan Bldg. An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling
Foisal Ahmed, Michihiro Shintani, Michiko Inoue (NAIST) DC2018-77
Recycled field programmable gate arrays (FPGAs) make a significant threat to mission critical systems due to their perfo... [more] DC2018-77
pp.37-42
HWS, VLD 2019-02-28
15:20
Okinawa Okinawa Ken Seinen Kaikan A SPICE Model Parameter Extraction Environment Using Automatic Differentiation
Aoi Ueda (NNCT), Michihiro Shintani (NAIST), Hiroshi Iwata, Ken'ichi Yamaguchi (NNCT), Michiko Inoue (NAIST) VLD2018-117 HWS2018-80
Accuracy of circuit simulation highly relys on two techniques: compact modeling and parameter extraction. As increasing ... [more] VLD2018-117 HWS2018-80
pp.145-150
HCGSYMPO
(2nd)

Mie Sinfonia Technology Hibiki Hall Ise -
Naoto Kato, Michiko inoue, Shiraiwa Aya, Masashi Nishiyama, Yoshio Iwai (Tottori Univ)
We investigate recognition performance between people and deep learning techniques using a simple task of visual inspect... [more]
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