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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:30 |
Miyazaki | NewWelCity Miyazaki | Immunity Evaluation of SRAM Core Using DPI with On-Chip Diagnosis Structures Takuya Sawada, Taku Toshikawa, Kumpei Yoshikawa (Kobe Univ.), Hidehiro Takata, Koji Nii (Renesas Electronics Corp.), Makoto Nagata (Kobe Univ.)  CPM2011-165 ICD2011-97 |
[more] | CPM2011-165 ICD2011-97 pp.85-90 |
| ICD, ITE-IST | 2011-07-22 09:50 |
Hiroshima | Hiroshima Institute of Technology | On-Chip Resonant Supply Noise Reduction Using Active Decoupling Capacitors Jinmyoung Kim (Tokyo Univ.), Toru Nakura (VDEC), Hidehiro Takata, Koichiro Ishibashi (Renesas Electronics), Makoto Ikeda, Kunihiro Asada (VDEC) ICD2011-27 |
[more] | ICD2011-27 pp.69-72 |
| ICD | 2010-12-17 13:50 |
Tokyo | RCAST, Univ. of Tokyo | Misleading Energy and Performance Claims in Sub/Near Threshold Digital Systems Yu Pu, Xin Zhang, Jim Huang (Univ. of Tokyo), Atsushi Muramatsu, Masahiro Nomura, Koji Hirairi, Hidehiro Takata, Taro Sakurabayashi, Shinji Miyano (STARC), Makoto Takamiya, Takayasu Sakurai (Univ. of Tokyo) ICD2010-122 |
Many of us in the field of ultra-low-Vdd processors experience difficulty in assessing the sub/near threshold circuit te... [more] | ICD2010-122 pp.135-140 |
| ICD, SDM | 2010-08-26 09:10 |
Hokkaido | Sapporo Center for Gender Equality | On-Chip Supply Resonance Noise Reduction Method for Multi-IP Cores utilizing Parasitic Capacitance of Sleep Blocks Jinmyoung Kim, Toru Nakura (Univ. of Tokyo.), Hidehiro Takata, Koichiro Ishibashi (Renesas Electronics), Makoto Ikeda, Kunihiro Asada (Univ. of Tokyo.) SDM2010-124 ICD2010-39 |
This paper proposes an on-chip supply resonance noise reduction method for multi-IP cores utilizing parasitic capacitanc... [more] | SDM2010-124 ICD2010-39 pp.1-4 |
| ICD | 2008-12-12 16:35 |
Tokyo | Tokyo Inst. Tech., Ohokayama Campus, Kokusa-Kouryu-Kaikan | Post-Silicon Programmed Body-Biasing Platform Suppressing Device Variability in 45 nm CMOS Technology Issei Kashima, Hiroaki Suzuki, Masanori Kurimoto (Renesas Technology Corp), Tadao Yamanaka (Renesas Design), Hidehiro Takata (Renesas Technology Corp), Hiroshi Makino (Osaka Institute of Tech), Hirofumi Shinohara (Renesas Technology Corp) ICD2008-128 |
The Post-Silicon Programmed Body-Biasing Platform is proposed to suppress device variability in the 45-nm CMOS technolog... [more] | ICD2008-128 pp.137-142 |
| VLD | 2008-09-29 13:30 |
Ishikawa | [Invited Talk]
Phase-Adjustable Error Detection Flip-Flops with 2-Stage Hold Driven Optimization and Slack Based Grouping Scheme for Dynamic Voltage Scaling Masanori Kurimoto, Hiroaki Suzuki (Renesas Technology), Rei Akiyama, Tadao Yamanaka, Haruyuki Okuma (Renesas Design), Hidehiro Takata, Hirofumi Shinohara (Renesas Technology) VLD2008-47 |
[more] | VLD2008-47 pp.1-6 |
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| ICD, SDM | 2007-08-24 08:55 |
Hokkaido | Kitami Institute of Technology | Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variation in SoCs Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura (Kobe Univ.), Rei Akiyama (Renesas Design), Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata (Renesas Technology), Makoto Nagata (Kobe Univ.) SDM2007-156 ICD2007-84 |
Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring o... [more] | SDM2007-156 ICD2007-84 pp.85-90 |
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