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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 26 of 26 [Previous]  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2017-11-06
13:25
Kumamoto Kumamoto-Kenminkouryukan Parea Hardware Implementation of Elliptic Curve Cryptography for Sensor-Node Applications
Ryosuke Saito, Hiromitsu Awano, Makoto Ikeda (The Univ. of Tokyo)
 [more]
VLD 2017-03-02
14:20
Okinawa Okinawa Seinen Kaikan [Invited Talk] Fast Monte Carlo based timing yield calculation via line sampling
Hiromitsu Awano (UTokyo), Takashi Sato (Kyoto Univ.) VLD2016-117
 [more] VLD2016-117
pp.83-84
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2015-12-01
15:05
Nagasaki Nagasaki Kinro Fukushi Kaikan Fast Monte Carlo based timing yield calculation
Hiromitsu Awano, Takashi Sato (Kyoto Univ.) VLD2015-43 DC2015-39
 [more] VLD2015-43 DC2015-39
pp.37-42
VLD 2015-03-04
08:50
Okinawa Okinawa Seinen Kaikan Physical Unclonable Function Using RTN-Induced Time-Dependent Frequency Variance in Ring Oscillator
Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato (Kyoto Univ.) VLD2014-174
(To be available after the conference date) [more] VLD2014-174
pp.117-122
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2014-11-26
15:35
Oita B-ConPlaza An efficient calculation of RTN-induced SRAM failure probability
Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato (Kyoto Univ.) VLD2014-74 DC2014-28
Failure rate degradation of an SRAM cell due to random telegraph noise (RTN) is calculated for the first time. An effic... [more] VLD2014-74 DC2014-28
pp.15-20
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-28
16:30
Miyazaki NewWelCity Miyazaki A study on parameter estimation for modeling of random-telegraph noise
Hiromitsu Awano, Hirofumi Shimizu, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato (Kyoto Univ.) VLD2011-66 DC2011-42
Random Telegraph Noise (RTN) is a physical phenomenon that is considered to determine reliability and performance of cir... [more] VLD2011-66 DC2011-42
pp.85-90
 Results 21 - 26 of 26 [Previous]  /   
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