|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-06 13:25 |
Kumamoto |
Kumamoto-Kenminkouryukan Parea |
Hardware Implementation of Elliptic Curve Cryptography for Sensor-Node Applications Ryosuke Saito, Hiromitsu Awano, Makoto Ikeda (The Univ. of Tokyo) |
[more] |
|
VLD |
2017-03-02 14:20 |
Okinawa |
Okinawa Seinen Kaikan |
[Invited Talk]
Fast Monte Carlo based timing yield calculation via line sampling Hiromitsu Awano (UTokyo), Takashi Sato (Kyoto Univ.) VLD2016-117 |
[more] |
VLD2016-117 pp.83-84 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-01 15:05 |
Nagasaki |
Nagasaki Kinro Fukushi Kaikan |
Fast Monte Carlo based timing yield calculation Hiromitsu Awano, Takashi Sato (Kyoto Univ.) VLD2015-43 DC2015-39 |
[more] |
VLD2015-43 DC2015-39 pp.37-42 |
VLD |
2015-03-04 08:50 |
Okinawa |
Okinawa Seinen Kaikan |
Physical Unclonable Function Using RTN-Induced Time-Dependent Frequency Variance in Ring Oscillator Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato (Kyoto Univ.) VLD2014-174 |
(To be available after the conference date) [more] |
VLD2014-174 pp.117-122 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2014-11-26 15:35 |
Oita |
B-ConPlaza |
An efficient calculation of RTN-induced SRAM failure probability Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato (Kyoto Univ.) VLD2014-74 DC2014-28 |
Failure rate degradation of an SRAM cell due to random telegraph noise (RTN) is calculated for the first time. An effic... [more] |
VLD2014-74 DC2014-28 pp.15-20 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-28 16:30 |
Miyazaki |
NewWelCity Miyazaki |
A study on parameter estimation for modeling of random-telegraph noise Hiromitsu Awano, Hirofumi Shimizu, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato (Kyoto Univ.) VLD2011-66 DC2011-42 |
Random Telegraph Noise (RTN) is a physical phenomenon that is considered to determine reliability and performance of cir... [more] |
VLD2011-66 DC2011-42 pp.85-90 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|