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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| ISEC |
2016-05-19
10:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Modified method for identification of template using non-overlapping template matching test
Yuichi Takeda (KAIT), Huzii Mituaki, Toshinari Kamakura, Norio Watanabe (Chuo Univ.)  ISEC2016-1 |
[more] |
ISEC2016-1
pp.1-4 |
| ISEC |
2014-12-19
14:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Identification of the template using the modified non-overlapping template matching test
Yuichi Takeda (KAIT), Mituaki Huzii, Toshinari Kamakura, Norio Watanabe (Chuo Univ.) ISEC2014-70 |
[more] |
ISEC2014-70
pp.7-10 |
| HCS, HIP, HI-SIGCOASTER [detail] |
2014-05-29
10:50 |
Okinawa |
Okinawa Industry Support Center |
Improvement of Technique to Estimate Visually Perceived Location by Using Reaching-Movements
-- Estimation Using Function of Chi-squared Distribution --
Kazuki Matsushima, Piyarat Silapasuphakornwong, Hiroshi Unno, Masahiro Suzuki, Kazutake Uehira, Yuichi Takeda (KAIT) HCS2014-3 HIP2014-3 |
This paper describes the improvement of technique that we previously proposed to estimate the visually perceived locatio... [more] |
HCS2014-3 HIP2014-3
pp.11-16 |
| ISEC |
2013-12-11
14:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Difference of the detection rate of the template in the modified non-overlapping template matching test
Yuichi Takeda (Kanagawa Inst. of Tech.), Mituaki Huzii, Toshinari Kamakura, Norio Watanabe (Chuo Univ.) ISEC2013-76 |
[more] |
ISEC2013-76
pp.21-23 |
| ISEC |
2012-05-18
13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Improvement of Non-over lapping template matching test by using Kolmogorov-Smirnov one-sided test
Yuichi Takeda (KAIT), Mituaki Huzii, Toshinari Kamakura, Norio Watanabe (Chuo Univ.) ISEC2012-1 |
[more] |
ISEC2012-1
pp.1-4 |
| ISEC |
2010-12-15
15:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Comparison between NIST template matching template test and our modified test
Yuichi Takeda (KAIT), Mituaki Huzii, Toshinari Kamakura, Norio Watanabe (Chuo Univ.) ISEC2010-70 |
[more] |
ISEC2010-70
pp.33-36 |
| ISEC |
2010-05-21
13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
The Suggestion of Corrected Non-overlapping Template Matching Test
Yuichi Takeda (KAIT), Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama (Chuo Univ.) ISEC2010-1 |
[more] |
ISEC2010-1
pp.1-4 |
| ISEC |
2009-05-22
10:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Corrected Non-overlapping Template Matching Test
Yuichi Takeda (Kanagawa Inst. of Tech.), Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama (Chuo Univ.) ISEC2009-2 |
[more] |
ISEC2009-2
pp.9-12 |
| ISEC |
2007-12-19
09:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Tests of Random Number and Autocorrelation Test for Cryptographic Applications
Yuichi Takeda (KAIT), Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama (Chuo Univ.) ISEC2007-112 |
[more] |
ISEC2007-112
pp.1-3 |
| ISEC |
2006-12-13
09:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Autocorrelation Test of Binary Sequence for Cryptographic Applications
Yuichi Takeda, Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama (Chuo Univ.) |
[more] |
ISEC2006-101
pp.1-3 |
| ISEC |
2005-12-16
10:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
The problem of template matching test in the testing randomness by NIST
Yuichi Takeda, Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama (Chuo Univ.) |
[more] |
ISEC2005-110
pp.1-4 |
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