|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD |
2010-03-10 16:15 |
Okinawa |
|
An efficient technique to search failure-areas for yield estimation via partial hyperspherephere Takanori Date, Shiho Hagiwara, Kazuya Masu (Tokyo Inst. of Tech.), Takashi Sato (Kyoto Univ.) VLD2009-105 |
Monte Carlo simulations have been widely adopted for analyzing circuit properties, such as SRAM yield,
under strong inf... [more] |
VLD2009-105 pp.37-42 |
ED |
2009-07-31 10:00 |
Osaka |
Osaka Univ. Icho-Kaikan |
[Keynote Address]
Prospect of Integrated MEMS Technology for Integration with Diverse Functionalities Kazuya Masu (Tokyo Ins. Tech.) ED2009-109 |
In the CMOS evolution, there are two technology directions; (1)Miniaturization or ” More Moore”, and (2) Integration wi... [more] |
ED2009-109 pp.39-40 |
SR |
2009-07-30 16:20 |
Tokyo |
Tokyo institute of technology |
[Invited Talk]
RF CMOS Integrated Circuit
-- Reconfigurability and Scalability -- Kazuya Masu, Noboru Ishihara, Shuhei Amakawa (Tokyo Tech) SR2009-48 |
We discuss the issues of present and future RF CMOS integrated circuit, which is the most significant hardware component... [more] |
SR2009-48 pp.165-166 |
VLD, IPSJ-SLDM |
2009-05-21 10:25 |
Fukuoka |
Kitakyushu International Conference Center |
Importance sampling with two-phase preprocess considering structural symmetry of SRAM circuits Takanori Date, Shiho Hagiwara, Takumi Uezono (Tokyo Inst. of Tech.), Takashi Sato (Kyoto Univ.), Kazuya Masu (Tokyo Inst. of Tech.) VLD2009-5 |
The influence of process variation on SRAM yield has become a serious consern in scaled technologies.
Monte Carlo-based... [more] |
VLD2009-5 pp.37-42 |
ICD, SDM |
2008-07-18 13:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
RF MEMS for Reconfigurable CMOS Radio Kazuya Masu (Tokyo Tech.) SDM2008-144 ICD2008-54 |
[more] |
SDM2008-144 ICD2008-54 pp.95-96 |
SIP, ICD, IE, IPSJ-SLDM (Joint) [detail] |
2007-10-26 15:50 |
Fukushima |
Aidu-Higasiyama-Onsen Kuturogijuku |
- Shiho Hagiwara, Takashi Sato, Kazuya Masu (Tokyo Inst. of Tech.) |
[more] |
|
SR |
2006-07-27 14:00 |
Kanagawa |
YRP |
[Technology Exhibit]
Multi-Standard Wireless Circuit using Reconfigurable Technique Tackya Yammouch, Daisuke Kawazoe, Yusaku Ito, Kenichi Okada, Kazuya Masu (Tokyo Tech.) SR2006-21 |
This paper proposes a dynamic reconfigurable architecture for analog RF circuits.
The architecture consists of RF circu... [more] |
SR2006-21 pp.51-58 |
ICD, CPM |
2005-09-09 14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
On chip transmission line interconnect Kazuya Masu, Kenichi Okada, Hiroyuki Ito (Tokyo Institute of Technology) |
Recent Si CMOS performance becomes to be limited by the long global interconnect characteristics. In this paper, we dis... [more] |
CPM2005-104 ICD2005-114 pp.47-52 |
SR |
2005-07-29 15:10 |
Kanagawa |
Yokosuka Research Park |
Design of Reconfigurable RF Wireless Circuit Kenichi Okada, Hirotaka Sugawara, Kazuya Masu (Tokyo Tech) |
This paper proposes a dynamic reconfigurable architecture for analog RF circuits. The architecture consists of RF circui... [more] |
SR2005-35 pp.97-103 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|