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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 12 of 12  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2022-12-15
15:45		 Online Online The trends of IEC/TC 56 Dependability
Ko Kawashima (ORIENTAL MOTOR), Yoshinobu Sato (Institute for Healthcare Quality Improvement), Yoshiki Kinoshita (Kanagawa Univ.), Hiroyuki Goto (D.SS), Akihiko Masuda (Reliability Seven Tools (R7) Practice Studio), Shigeru Yanagi (National Defense Academy), Makoto Takeyama (Kanagawa Univ.), Tadahiro Shibutani (Yokohama National Univ.) R2022-47		 IEC/TC 56 is in charge of developing and revising international dependability standards related horizontally to both of ... [more] R2022-47
pp.19-24
EMD, R 2020-02-14
13:35		 Shizuoka   Trend on standardization of Dependability -- Outline of IEC TC 56 2016 Sydney international meeting and drafts from Japan --
Hiroyuki Goto (FDK), Yoshinobu Sato (The IHQI, Tokyo Healthcare Foundation), Fumiaki Harada (D-Tech Partners), Yoshiki Kinoshita (Kanagawa University) R2019-54 EMD2019-54		 IEC/TC 56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Shanghai, China... [more] R2019-54 EMD2019-54
pp.1-6
R 2017-12-15
15:55		 Tokyo Kikai-Shinko-Kaikan Bldg. R2017-60 Plenary meeting of IEC TC 56 “Dependability” was held in Tokyo this year. Firstly, Mr. Mori (METI) welcomed the TC 56 an... [more] R2017-60
pp.25-30
R 2016-12-16
14:15		 Kanagawa Maholoba Minds Miura (Miura City, Kanagawa Prefecture) Trend on standardization of dependability -- Outline of IEC TC56 2016 Sydney international meeting and drafts from Japan --
Hiroyuki Goto (FDK), Yoshinobu Sato (JACO), Yoshiki Kinoshita (KU) R2016-54		 IEC/TC 56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Sydney, Austral... [more] R2016-54
pp.1-6
R 2016-07-29
15:20		 Hokkaido Otaru Chamber of Commerce and Industry Trend of reliability test term in JIS Z 8115 draft revision considering the integrity of the IEC 60050-192 Dependability
Akihiko Masuda (R7 Studio), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor), Fumiaki Harada (FXAT) R2016-17		  [more] R2016-17
pp.25-30
EMD, R 2016-02-19
15:35		 Shizuoka Azarea,Shizuoka Latest Trends of JIS Z8115 DependabilityTerminology amendment drafts -- Focus on relevant terms of failure and fault --
Fumiaki Harada (FXAT), AKihiko Masuda (R7 Studio), Tateki NIsh (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor) R2015-70 EMD2015-98		  [more] R2015-70 EMD2015-98
pp.31-36
R 2015-07-31
16:35		 Aomori   Latest trends of JIS reliability design and analysis terminology -- Comparison with JIS Z 8115 amendment drafts and IEC 60050-192 first edition --
Akihiko Masuda (R7 Studio), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental Motor), Fumiaki Harada (FXAT) R2015-21		 Dependability (reliability) terms of IEC 60050-192 standard was enacted in February 2015. It has passed 25 years since t... [more] R2015-21
pp.43-48
R 2014-12-19
15:00		 Tokyo   Aims and Key Issues of the Revision of JIS Z 8115 Dependability (Reliability) Terms -Part 2-
Ko Kawashima (ORIENTAL MOTOR), Akihiko Masuda (Tokyo Univ. of Science), Tateki Nishi (DNV GL Business Assurance Japan), Hiroyuki Goto (FDK) R2014-69		 The revision of JIS Z 8115:2000 Glossary of Used in Dependability is proceeded. In this revision, some terms
and defini... [more]		 R2014-69
pp.25-28
R 2014-12-19
15:25		 Tokyo   Trend on standardization of dependability -- Outline of IEC TC56 and agenda on international meeting --
Hiroyuki Goto (FDK), Yoshinobu Sato (JACO), Yoshiki Kinoshita, Makoto Takeyama (KU) R2014-70		 IEC/TC56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Prague, Czech Re... [more] R2014-70
pp.29-34
R 2014-08-01
15:45		 Hokkaido Smile Hotel Hakodate Aims and Key Issues of the Amendment of JIS Z 8115 Dependability (Reliability) Terms (Part 1)
Akihiko Masuda (Tokyo Univ. of Science), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental Motor) R2014-19		 Since JIS Z 8115 standard of reliability term was revised in 2000, 14 years have passed. There was the existence of the ... [more] R2014-19
pp.31-36
R 2012-12-14
11:15		 Tokyo   Trend on standardization of dependability -- Outline of IEC TC56 and agenda on international meeting --
Fumiaki Harada (FXAT), Hiroyuki Gotoh (FUJITSU), Hiroki Takamura (JST), Yoshiki Kinoshita, Makoto Takeyama (AIST) R2012-71		  [more] R2012-71
pp.19-26
R 2011-12-16
13:00		 Tokyo   Trend on standardization of dependability -- Outline of IEC TC56 and agenda on international meeting --
Fumiaki Harada (FXAT), Hiroyuki Gotoh (FUJITSU), Hiroki Takamura (JST), Yoshiki Kinoshita, Makoto Takeyama (AIST) R2011-37		  [more] R2011-37
pp.1-7
 Results 1 - 12 of 12  /   
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