IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2021-07-01
15:00		 Online Online Proposals of Magnetic Field Probes for Detecting the ESD Current
Ryota Kobayashi, Tsuyoshi Kobayashi, Yuichi Sasaki (Mitsubishi Electric) EMCJ2021-21		 EMC designs and countermeasures are significant as the performance of the electronic equipment becomes higher and the sy... [more] EMCJ2021-21
pp.24-29
CNR 2019-06-13
11:00		 Tokyo   PLANTOPIA -- Self-moisture Sensing and Sharing the information with the plants through server and use natural languages to present their condition to human. --
Ryoga Sato, Ryota Kobayashi, Yifan Zhou, Midori Sugaya (SIT) CNR2019-4		 (To be available after the conference date) [more] CNR2019-4
pp.19-22
EMCJ, IEE-EMC 2018-12-14
14:05		 Aichi   Noise Detection Circuits for Specifying the Propagation Path on the PCB
Ryota Kobayashi, Kenji Hirose, Hideyuki Oh-hashi, Chiharu Miyazaki (Mitsubishi Electric) EMCJ2018-93		  [more] EMCJ2018-93
pp.57-62
EMCJ 2018-01-18
15:50		 Okayama   Evaluation of Visualization System for Pulse Noise Propagations on Printed Circuit Boards
Takashi Kuwahara, Yoshihiro Akeboshi, Tetsu Owada, Ryota Kobayashi, Yusuke Yamakaji, Kenji Hirose, Hideyuki Ohashi (Mitsubishi Electric) EMCJ2017-94		 A high voltage noise such as static electricity causes failures and malfunction of electronic devices. However, it has b... [more] EMCJ2017-94
pp.37-42
EMCJ, IEE-EMC 2015-12-18
13:30		 Aichi TOYOTA CENTRAL R&D LABS., INC. The evaluation of the contactless probe for measuring noise -- The consideration of the butterfly type probe having the sensitivity for the various wiring direction --
Kobayashi Ryota, Kobayashi Tsuyoshi, Miyazaki Chiharu, Oka Naoto, Ohashi Hideyuki (Mitsubishi Electric) EMCJ2015-96		  [more] EMCJ2015-96
pp.39-44
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2013-11-27
09:15		 Kagoshima   Co-design for reducing power supply noises with On-die PDN Impedance
Ryota Kobayashi, Hiroki Otsuka, Genki Kubo, Sho Kiyoshige, Wataru Ichimura, Masahiro Terasaki, Toshio Sudo (Shibaura Inst. of Tech.) CPM2013-109 ICD2013-86		 Power integrity is a serious issue in CMOS LSI systems, because power supply noise induces logic instability and electro... [more] CPM2013-109 ICD2013-86
pp.7-12
 Results 1 - 6 of 6  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan