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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICD, CPSY, CAS | 2017-12-14 15:10 |
Okinawa | Art Hotel Ishigakijima | Accelerated Transient Analysis of Power MOSFETs by the Matrix Exponential Method Tatsuya Kamei, Shigetaka Kumashiro, Kazutoshi Kobayashi (KIT)  CAS2017-87 ICD2017-75 CPSY2017-84 |
In designing and developing power devices, reduction of simulation time is required. In this study, an accurate metric f... [more] | CAS2017-87 ICD2017-75 CPSY2017-84 pp.107-112 |
| SDM | 2017-11-10 14:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
An Accurate Metric to Control Time Step of Transient Device Simulation by Matrix Exponential Method Shigetaka Kumashiro, Tatsuya Kamei, Akira Hiroki, Kazutoshi Kobayashi (KIT) SDM2017-70 |
An accurate metric for the time step control in the power device transient simulation is proposed. This metric contains ... [more] | SDM2017-70 pp.47-52 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 14:15 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | Evaluation of Radiation-Hard Circuit Structures in a FDSOI Process by TCAD Simulations Kodai Yamada, Haruki Maruoka, Shigehiro Umehara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-49 DC2016-43 |
According to the Moore's law, LSIs are miniaturized and the reliability of LSIs is degraded. To improve the tolerance ... [more] |
VLD2016-49 DC2016-43 pp.31-36 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 14:40 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | Evaluation of Soft Error Hardness of FinFET and FDSOI Processes by the PHITS-TCAD Simulation System Shigehiro Umehara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-50 DC2016-44 |
The impact of soft errors has been serious with process scaling of integrated circuits. Simulation methods for soft erro... [more] | VLD2016-50 DC2016-44 pp.37-41 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 15:05 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | Evaluation of Soft Error Rates of FlipFlops on FDSOI by Heavy Ions Masashi Hifumi, Shigehiro Umehara, Haruki Maruoka, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-51 DC2016-45 |
We evaluate tolerance for soft errors of FFs on a 28/65 nm FDSOI. We fabricated three different layouts of non-redundant... [more] | VLD2016-51 DC2016-45 pp.43-48 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 15:30 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46 |
We propose a circuit analysis method using the bimodal RTN (random telegraph noise) model of the defect-centric distri... [more] |
VLD2016-52 DC2016-46 pp.49-54 |
| ICD, CPSY | 2015-12-17 09:40 |
Kyoto | Kyoto Institute of Technology | RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process Azusa Oshima (KIT), Pieter Weckx, Ben Kaczer (IMEC), Takashi Matsumoto (UT), Kazutoshi Kobayash (KIT), Hidetoshi Onodera (KU) ICD2015-63 CPSY2015-76 |
[more] | ICD2015-63 CPSY2015-76 pp.1-6 |
| ICD, CPSY | 2015-12-17 16:00 |
Kyoto | Kyoto Institute of Technology | [Poster Presentation]
RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process Azusa Oshima (KIT), Pieter Weckx, Ben Kaczer (IMEC), Takashi Matsumoto (UT), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (KU) |
[more] | |
| ICD, CPSY | 2015-12-18 09:00 |
Kyoto | Kyoto Institute of Technology | Evaluation of Soft Error Tolerance of Redundant Flip-Flop in 65nm Bulk and FD-SOI Processes. Eiji Sonezaki, Kubota Kanto, Masaki Masuda, Shohei Kanda, Jun Furuta, Kazutoshi Kobayashi (KIT) ICD2015-83 CPSY2015-96 |
According to process down scaling, LSI becomes less reliable for soft errors. To increase the tolerance of FFs for soft ... [more] | ICD2015-83 CPSY2015-96 pp.69-74 |
| RECONF | 2015-06-19 17:00 |
Kyoto | Kyoto University | [Invited Talk]
Reliability on Integrated Circuits Kazutoshi Kobayashi (Kyoto Inst. of Tech.) RECONF2015-13 |
[more] | RECONF2015-13 p.71 |
| VLD | 2015-03-03 09:40 |
Okinawa | Okinawa Seinen Kaikan | Methodology for Reduction of Timing Margin by Considering Correlation between Process Variation and BTI Michitarou Yabuuchi, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2014-163 |
We analyze the efficiency of the design methodology by using circuit simulations. The design methodology which consider... [more] |
VLD2014-163 pp.61-66 |
| ICD, CPSY | 2014-12-02 14:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Measurements and Evaluations of Aging Degradation Caused by Plasma Induced Damage in 65 nm Process Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. Tech.) ICD2014-106 CPSY2014-118 |
Degradations of reliability caused by plasma induced damage (PID) have become a significant concern with miniaturizing a... [more] | ICD2014-106 CPSY2014-118 pp.123-128 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2014-11-26 11:35 |
Oita | B-ConPlaza | Voltage Dependence of Single Event Transient Pulses on 65nm Silicon-on-Thin-BOX and Bulk Processes Eiji Sonezaki, Kuiyuan Zhang, Jun Furuta, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2014-84 DC2014-38 |
Recently, the growth of power consumption has been serious by process scaling. The lower voltage is most effective to i... [more] |
VLD2014-84 DC2014-38 pp.93-97 |
| ICD, SDM | 2014-08-04 09:00 |
Hokkaido | Hokkaido Univ., Multimedia Education Bldg. | [Invited Talk]
A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14μA Sleep Current using Reverse-Body-Bias Assisted 65nm SOTB CMOS Technology Koichiro Ishibashi (UEC), Nobuyuki Sugii (LEAP), Kimiyoshi Usami (SIT), Hideharu Amano (KU), Kazutoshi Kobayashi (KIT), Cong-Kha Pham (UEC), Hideki Makiyama, Yoshiki Yamamoto, Hirofumi Shinohara, Toshiaki Iwamatsu, Yasuo Yamaguchi, Hidekazu Oda, Takumi Hasegawa, Shinobu Okanishi, Hiroshi Yanagita (LEAP) SDM2014-62 ICD2014-31 |
[more] | SDM2014-62 ICD2014-31 pp.1-4 |
| ICD, SDM | 2014-08-05 14:55 |
Hokkaido | Hokkaido Univ., Multimedia Education Bldg. | Initial Frequency Degradation on Ring Oscillators in 65-nm SOTB Process Caused by Plasma-Induced Damage Azusa Oshima, Ryo Kishida, Michitarou Yabuuchi, Kazutoshi Kobayashi (KIT) SDM2014-79 ICD2014-48 |
Reliability issues, such as plasma-induced damage (PID) and Bias Temperature Instability (BTI), become dominant on inte... [more] |
SDM2014-79 ICD2014-48 pp.93-98 |
| VLD | 2014-03-03 13:00 |
Okinawa | Okinawa Seinen Kaikan | Characterization of Random Telegraph Noise using Inhomogeneous Ring Oscillator Shohei Nishimura, Takashi Matsumoto (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) VLD2013-134 |
RTN has severe impact on combinational logic circuits. Extracting accurate (RTN-induced) variation information is a huge... [more] | VLD2013-134 pp.1-6 |
| VLD | 2014-03-03 13:25 |
Okinawa | Okinawa Seinen Kaikan | Impact of CMOS Transistor Random Telegraph Noise on Combinational Circuit Delay Takashi Matsumoto (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) VLD2013-135 |
[more] | VLD2013-135 pp.7-12 |
| VLD | 2014-03-05 10:25 |
Okinawa | Okinawa Seinen Kaikan | Evaluation of Multiple Cell Upsets Considering Parasitic Bipolar Effects Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) VLD2013-157 |
As a result of the process scaling, radiation-induced Multiple Cell Upsets (MCUs) become major issue for LSI reliabilit... [more] |
VLD2013-157 pp.125-130 |
| IPSJ-SLDM, CPSY, RECONF, VLD [detail] | 2014-01-29 14:50 |
Kanagawa | Hiyoshi Campus, Keio University | Prediction Model for Process Variation and BTI-Induced Degradation by Measurement Data on FPGA Michitarou Yabuuchi, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2013-129 CPSY2013-100 RECONF2013-83 |
We propose a prediction model for BTI-induced degradation by measurement data on 65nm-process FPGAs. BTI-induced degrad... [more] |
VLD2013-129 CPSY2013-100 RECONF2013-83 pp.161-166 |
| ICD | 2014-01-29 11:00 |
Kyoto | Kyoto Univ. Tokeidai Kinenkan | [Invited Talk]
Reliability on Integrated Circuits
-- Details of Soft Errors -- Kazutoshi Kobayashi (Kyoto Inst. of Tech.) ICD2013-134 |
本講演では，LSIの微細化とともに悪化している信頼性のうち，特にソフトエラー と呼ばれる一時故障に焦点を当ててその概要を紹介する．ソフトエラーは主に パッケージからのα線，宇宙からの中性子線によるメモリやFFの一時的な反転 である．α... [more] |
ICD2013-134 p.81 |
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