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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SS 2014-03-11
15:45		 Okinawa Tenbusu Naha Facilitate Defect Removal Using Static Analysis Tools by introducing competition
Satoshi Arai (Waseda Univ.), Kazunori Sakamoto (NII), Hironori Washizaki, Yoshiaki Fukazawa (Waseda Univ.) SS2013-81		 (To be available after the conference date) [more] SS2013-81
pp.55-60
MSS, SS 2013-03-06
16:20		 Fukuoka Shikanoshima Multiple Programming Languages Support Customizable Bug Localization Framework
Kiyofumi Shimojo, Kazunori Sakamoto, Hironori Washizaki, Yoshiaki Fukazawa (Waseda Univ.) MSS2012-67 SS2012-67		 Bug localization technique is effectual approach for locating software bugs using the number of failing and passing test... [more] MSS2012-67 SS2012-67
pp.45-50
SS 2012-03-13
17:10		 Okinawa Tenbusu-Naha Fault-Localization that focuses on the program structure and debugging support
Kiyofumi Shimojo, Kazunori Sakamoto, Hironori Washizaki, Yoshiaki Fukazawa (Waseda Univ.) SS2011-73		 Fault localization is the techniques that estimates location of bugs causing the test failure using test results. Fault ... [more] SS2011-73
pp.97-102
SS 2011-06-30
16:30		 Overseas Korea Univ. (Seoul) A Tool For Detecting Duplicated Test Code Based On Test Coverage to Assist TDD
Kazunori Sakamoto (Waseda Univ.), Takuto Wada (Towers Quest), Hironori Washizaki, Yoshiaki Fukazawa (Waseda Univ.) SS2011-8		 The amount of test code has increased as the test technology has developed and the amount of duplicated test code that i... [more] SS2011-8
pp.41-46
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