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Paper #
ICD
2005-04-15
14:00
Fukuoka
Analysys of SRAM neutron-Induced Errors Based on the Consideration of Both Charge-Collection and Parasitic-BipolarFailure Modes
Kenichi Osada
(
Hitachi
),
Naoki Kitai
(
Hitachi ULSI
),
Shiro Kamohara
(
Renesas
),
Takayuki Kawahara
(
Hitachi
)
This paper describes an investigation of the upsetting of values in cells hit by alpha particles or neutrons, in which t...
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ICD2005-18
pp.31-36
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