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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IT, ISEC, WBS |
2013-03-08 10:30 |
Osaka |
Kwansei Gakuin Univ., Osaka-Umeda Campus |
Laser Fault Injection Attack on Non-Decapped Contact Smart Card Hitoshi Ono, Yuu Tsuchiya, Tsuyoshi Toyama, Takeshi Kishikawa, Shohei Saito (Yokohama National Univ.), Akihiko Sasaki (MORITA TECH), Akashi Satoh (Univ. of Tokyo), Tsutomu Matsumoto (Yokohama National Univ.) IT2012-93 ISEC2012-111 WBS2012-79 |
[more] |
IT2012-93 ISEC2012-111 WBS2012-79 pp.195-202 |
ISEC |
2012-12-12 14:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
The YNU's Method for Acquiring Power-Consumption Traces Developed for DPA Contest v3 Tsutomu Matsumoto, Takeshi Kishikawa, Hitoshi Ono, Shohei Saito, Yuu Tsuchiya (Yokohama Nat'l Univ.), Akihiko Sasaki (MORITA TECH), Tsuyoshi Toyama (Yokohama Nat'l Univ.) ISEC2012-76 |
[more] |
ISEC2012-76 pp.29-36 |
ISEC, LOIS |
2012-11-21 14:15 |
Shizuoka |
Shizuoka City Industry-University Exchange Center |
How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromaginetic Irradiataion Yuu Tsuchiya, Takeshi Kishikawa, Shohei Saito, Tsuyoshi Toyama (YNU), Akihiko Sasaki (MORITA TECH), Akashi Satoh (VDEC, Univ. Tokyo), Tsutomu Matsumoto (YNU) ISEC2012-57 LOIS2012-32 |
Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been conside... [more] |
ISEC2012-57 LOIS2012-32 pp.1-8 |
ISEC, LOIS |
2005-11-15 14:05 |
Fukuoka |
Kitakyushu Science and Research Park |
On Reference Positions and Bits in Differential Power Analysis Attack against DES Yousuke Kakuishi, Akihiko Sasaki, Koki Abe (UEC) |
Differential power analysis (DPA) is a kind of side channel attacks which enables attackers to estimate secret informati... [more] |
ISEC2005-106 OIS2005-69 pp.51-56 |
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