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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 12 of 12  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
AP, MW
(Joint)		 2018-09-21
15:00		 Tokyo Tokyo Tech Discussions on Dielectric Measurement Apparatus for Balanced-Type Disk Resonator Method
Yoshio Kobayashi, Sotaro Kobayashi (SUMTEC) MW2018-67		 Balanced-type disk resonator method is useful to measure the complex permittivity in the normal direction of dielectric ... [more] MW2018-67
pp.45-48
AP, MW
(Joint)		 2017-09-21
15:25		 Saitama Saitama University [Special Talk] History of Technical Development on Microwave Dielectric Filters
Yoshio Kobayashi (SUMTEC) MW2017-71		 This paper describes a short history on technical development for evaluation techniques of low loss dielectric materials... [more] MW2017-71
pp.17-22
MW 2013-12-19
16:45		 Saitama Saitama Univ. Discussions on Measurement Accuracy of Complex Relative Permittivity by a Balanced-type Circular Disk Resonator Method
Jun Nakatsutsumi (Saitama Univ.), Yoshio Kobayashi (SUMTEC), Zhewang Ma (Saitama Univ.) MW2013-163		 A balanced-type circular disk resonator method is used for measuring complex permittivity in the normal direction (relat... [more] MW2013-163
pp.71-76
MW 2013-06-28
11:45		 Aichi Nagoya Institute of Tech. Precise compensation based on the electromagnetic analysis for complex permittivity perturbation method using a TM<sub>010</sub> mode cylindrical cavity
Hirokazu Kawabata (TITC), Yoshio Kobayashi (Sumtec) MW2013-44		 A perturbation method using the TM<sub>010</sub> mode of cylindrical cavity is commonly used to measure the complex perm... [more] MW2013-44
pp.73-78
MW 2012-12-14
10:45		 Yamanashi Univ. of Yamanashi Measurement Method of Relative Permittivity and Permeability for a Ferrite Rod Using the TM and TE Modes in a Cylindrical Cavity
Hirokazu Kawabata (TITC), Yoshio Kobayashi (SUMTEC) MW2012-136		 A measurement method using a pair of the TM and TE modes of cylindrical cavity is proposed to measure the accurate relat... [more] MW2012-136
pp.55-60
MW 2012-11-22
10:45		 Okinawa   Discussions on Measurement Ranges in Balanced-Type Circular Disk Resonator Method to Measure Dielectric Substrates
Yoshio Kobayashi (SUMTEC) MW2012-121		 Balanced-type circular disk resonator method, excited by coaxial lines, is commonly used to measure the frequency depend... [more] MW2012-121
pp.47-50
MW 2012-10-19
09:00		 Tochigi Utsunomiya Univ. Relative conductivity measurements of a copper-clad dielectric substrate using a sapphire rod resonator
Masayuki Tsunemitsu (Saitama Univ.), Yoshio Kobayashi (SUMTEC ,Inc.), Zhewang Ma (Saitama Univ.) MW2012-97		 The two rod resonator method and the one rod resonator method have been commonly used to measure the surface relative co... [more] MW2012-97
pp.93-98
MW 2011-11-24
13:30		 Okinawa   Some discussions of coupling coefficient between two resonators
Yoshio Kobayashi (SUMTEC) MW2011-113		  [more] MW2011-113
pp.1-4
MW 2011-10-21
09:50		 Tokyo The University of Electro-Communications Measurements of Complex Permittivity Anisotropy in Plane of a Sapphire Substrate
Shuhei Wadayama (Saitama Univ.), Yoshio Kobayashi (SUMTEC), Zhewang Ma (Saitama Univ.) MW2011-102		 We proposed a measurement method to evaluate complex permittivity anisotropy in plane for dielectric laminate substrates... [more] MW2011-102
pp.89-94
MW 2010-11-25
13:00		 Okinawa Tiruru Frequency dependence measurements of interface conductivity of copper-clad dielectric laminated substrates
Masayuki Tsunemitsu (Saitama Univ.), Yoshio Kobayashi (SUMTEC, Inc.), Zhewang Ma (Saitama Univ.) MW2010-105		 The interface conductivity of copper-clad dielectric laminated substrates has been measured so far by the dielectric res... [more] MW2010-105
pp.1-6
MW 2010-09-10
10:55		 Tokyo Tokyo Inst. of Tech. Some Discussions on Measurement Range in the Balanced-Type Circular Disk Resonator Method
Shogo Kaneko (Saitama Univ), Yoshio Kobayashi (SUMTEC), Zhewang Ma (Saitama Univ) MW2010-79		  [more] MW2010-79
pp.69-74
MW 2010-09-10
11:15		 Tokyo Tokyo Inst. of Tech. Microwave Measurement of Complex Permittivity Anisotropy in Plane of Dielectric Laminate Substrates
Shuhei Wadayama (Saitama Univ.), Yoshio Kobayashi (SUMTEC), Zhewang Ma (Saitama Univ.) MW2010-80		 This paper proposes a measurement method to evaluate complex permittivity anisotropy in plane for dielectric laminate su... [more] MW2010-80
pp.75-80
 Results 1 - 12 of 12  /   
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