| 講演抄録／キーワード |
| 講演名 |
On the Variations of Shunt Characterization Technique of Decoupling Transmission Line for Millimeter-Wave CMOS Applications
○Korkut Kaan Tokgoz・Kimsrun Lim・Kenichi Okada・Akira Matsuzawa（Tokyo Inst. of Tech.） エレソ技報アーカイブはこちら |
| 抄録 |
（和） |
Decoupling transmission line (TL) is a low characteristic impedance TL that is used for isolating DC and RF signals in millimeter-wave CMOS circuits. Low characteristic impedance makes the direct measurements difficult for characterization. A shunt characterization method is presented for the characterization. In this method, the S-parameters are calculated directly. Nevertheless, the results might change according to calculation procedure. In this work, variations on shunt characterization method are investigated and their effects on millimeter-wave CMOS amplifier simulation accuracy are introduced. |
| （英） |
Decoupling transmission line (TL) is a low characteristic impedance TL that is used for isolating DC and RF signals in millimeter-wave CMOS circuits. Low characteristic impedance makes the direct measurements difficult for characterization. A shunt characterization method is presented for the characterization. In this method, the S-parameters are calculated directly. Nevertheless, the results might change according to calculation procedure. In this work, variations on shunt characterization method are investigated and their effects on millimeter-wave CMOS amplifier simulation accuracy are introduced. |
| キーワード |
（和） |
CMOS / decoupling transmission line / metal-insulator-metal / shunt characterization / mm-wave / variations / / |
| （英） |
CMOS / decoupling transmission line / metal-insulator-metal / shunt characterization / mm-wave / variations / / |
| 文献情報 |
信学技報 |
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