Paper Abstract and Keywords |
Presentation |
2017-12-15 14:20
Estimation by non-negative matrix factorization of dislocation regions in photoluminescence image of multicrystalline silicon Hiroaki Kudo, Yusuke Hayama, Tetsuya Matsumoto, Kentaro Kutsukake, Noritaka Usami (Nagoya Univ.) IMQ2017-22 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this report, we studied a specified method of regions including dislocations which are crystallographic defects in a photoluminescence (PL) image of multicrystalline silicon wafers. We utilized a method of non-negative matrix factorization (NMF) to reconstruct the wafer image. We assumed regions of dislocations caused large represent errors and presented darker colors. We obtained effective results by the proposed method than results of sparse coding methods using bases based on independent component analysis or NMF. Sparse coding methods allow negative values as coefficients matrix. As sample images of the learning process, images without dislocations lead effective results. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
multicrystalline silicon / photoluminescence image / dislocation / non-negative matrix factorization / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 117, no. 356, IMQ2017-22, pp. 13-18, Dec. 2017. |
Paper # |
IMQ2017-22 |
Date of Issue |
2017-12-08 (IMQ) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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IMQ2017-22 |
Conference Information |
Committee |
IMQ |
Conference Date |
2017-12-15 - 2017-12-15 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Shizuoka University, Hamamatsu Campus |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Picture Display, etc. |
Paper Information |
Registration To |
IMQ |
Conference Code |
2017-12-IMQ |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Estimation by non-negative matrix factorization of dislocation regions in photoluminescence image of multicrystalline silicon |
Sub Title (in English) |
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Keyword(1) |
multicrystalline silicon |
Keyword(2) |
photoluminescence image |
Keyword(3) |
dislocation |
Keyword(4) |
non-negative matrix factorization |
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1st Author's Name |
Hiroaki Kudo |
1st Author's Affiliation |
Nagoya University (Nagoya Univ.) |
2nd Author's Name |
Yusuke Hayama |
2nd Author's Affiliation |
Nagoya University (Nagoya Univ.) |
3rd Author's Name |
Tetsuya Matsumoto |
3rd Author's Affiliation |
Nagoya University (Nagoya Univ.) |
4th Author's Name |
Kentaro Kutsukake |
4th Author's Affiliation |
Nagoya University (Nagoya Univ.) |
5th Author's Name |
Noritaka Usami |
5th Author's Affiliation |
Nagoya University (Nagoya Univ.) |
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Speaker |
Author-1 |
Date Time |
2017-12-15 14:20:00 |
Presentation Time |
25 minutes |
Registration for |
IMQ |
Paper # |
IMQ2017-22 |
Volume (vol) |
vol.117 |
Number (no) |
no.356 |
Page |
pp.13-18 |
#Pages |
6 |
Date of Issue |
2017-12-08 (IMQ) |
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